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Mixed Signal Oscilloscope and Logic Analysis Seminar
Broadcast on: 4/14/2009 [11:00 am - 12:00 pm Eastern Daylight Time (GMT -04:00, New York)]
- Joseph Ting, High Frequency Instruments Product Manager, Yokogawa
If you are an embedded systems design or test engineer working with micro-controllers, DSPs, or FPGAs, you won't want to miss this seminar. Designing with embedded ICs in your circuit requires an ever larger library of test tools to measure and troubleshoot on-chip A/D and D/A sections, serial and parallel digital busses, and other assorted digital control signals. As a design or test engineer you would like to have the most versatile tool possible.
In this seminar we will cover:
Advances in mixed signal test technologies.
It will teach you how the latest mixed signal instruments can perform the function of several traditional instruments in one, and even enable methods that are not possible with a logic analyzer or protocol analyzer alone.
It will discuss measurement techniques such as state and timing mode logic analysis, triggering and real-time decoding of advanced serial protocols, and considerations for correlating or analyzing analog measurements.
This seminar will also spotlight special, useful methods for making meaningful display and analysis of your mixed signals, such as "bundling", "virtual D/A", logic persistence, and "history" memory segmentation.