MEASUREMENT OF I/O CHARACTERISTICS OF SEMICONDUCTOR DEVICES
The GS820 is used to apply voltage Vi to the gate input of a logic IC from channel 1 and measure gate output voltage Vo on channel 2. The source and measure channels allow the I/O characteristics of the gate to be measured.
Generators, Sources
For general purpose standalone applications or as core components in a high speed test and measurement system, Yokogawa sources and signal generators are highly accurate and functional.
