MEASUREMENT OF THE STATIC CHARACTERISTICS OF THREE-TERMINAL SEMICONDUCTER DEVICES (TRANSISTORS, FETS, ETC.)
Measurement of the Static Characteristics of Three-Terminal Semiconductor Devices (Transistors, FETs, etc.)
The GS820 can measure drain current ID by applying gate-source voltage VGS from channel 1 and drain-source voltage VDS from channel 2.
Oscilloscopes
World-class digital oscilloscopes from Yokogawa: The digital oscilloscopes have high-speed sampling and a wide range of bandwidths that can be utilized for design and development of electronic devices. The ScopeCorders have the advantages of both a digital oscilloscope and a multi-channel data recorder.
Data Acquisition Equipment
Yokogawa data acquisition systems give you the most flexibility and power to measure, display, store, and even actuate any number of physical or electrical phenomena.
