MEASUREMENT OF THE STATIC CHARACTERISTICS OF THREE-TERMINAL SEMICONDUCTER DEVICES (TRANSISTORS, FETS, ETC.)
Measurement of the Static Characteristics of Three-Terminal Semiconductor Devices (Transistors, FETs, etc.)
The GS820 can measure drain current ID by applying gate-source voltage VGS from channel 1 and drain-source voltage VDS from channel 2.
Oscilloscopes
World-class digital oscilloscopes from Yokogawa: The digital oscilloscopes have high-speed sampling and a wide range of bandwidths that can be utilized for design and development of electronic devices. The ScopeCorders have the advantages of both a digital oscilloscope and a multi-channel data recorder.
