MEASUREMENT OF I/O CHARACTERISTICS OF SEMICONDUCTOR DEVICES
The GS820 is used to apply voltage Vi to the gate input of a logic IC from channel 1 and measure gate output voltage Vo on channel 2. The source and measure channels allow the I/O characteristics of the gate to be measured.
Data Acquisition Equipment
Yokogawa data acquisition systems give you the most flexibility and power to measure, display, store, and even actuate any number of physical or electrical phenomena.
