TA720 TIME INTERVAL ANALYZERS (DISCONTINUED)

The TA720 Time Interval Analyzer has larger memory capacity and is faster than the highly regarded TA520 and TA320. It has a maximum sampling rate of 80 MS/s, and maximum memory capacity of 1024 k samples (in Time stamp mode). In addition, the TA720 has a variety of completely new functions, such as a dual measurement function, inter-symbol interference analysis function, and an optional Ethernet and PC card interface. This time interval analyzer is the ideal analysis tool for jitter analysis of high-speed optical disk signals and recording characteristic evaluations.

 
 

Highlights of this Time Interval Analyzer, include:

Continuous measurement at up to 80 MS/s

  • Maximum Continuous Sampling Rate 80 MS/s
  • Dual Measurement Function
  • Inter-Symbol Interference Analysis Function, Built-in Printer, and GP-IB Interface are all standard
  • Ethernet and PC Card Interface (optional)

High-Speed Continuous Measurement at up to 80 MS/s

  • The TA720 can continuously measure signals as fast as eight times DVD speed. It continuously measures high-speed signals from sources such as fast-rotating CDs and DVDs, and next-generation optical disks without dropping measurements. This makes accurate jitter analysis possible.
Dual Measurement Function
  • This function enables two measurements to be done simultaneously. The available measurement combinations are Period A & Period B, Period A & A-to-B time interval, Pulse A & Pulse B, and Pulse A & A-to-B time interval. During optical disk jitter measurement, for example, it is possible to perform two types of jitter measurements (data-data jitter and data-clock jitter).

Inter-Symbol Interference Analysis Function
  •  With this function, it is possible to extract and analyze data corresponding to set code conditions (such as all T spaces between 3T marks). The distribution of the extracted data and related statistics can also be displayed and compared against all of the data at the same time. When combined with the dual measurement function, the inter-symbol interference analysis function enables even faster jitter analysis through techniques such as extracting data-clock data using pulse width as a condition.
Ethernet and PC Card Interface (optional)
  •  Data transmitted to the TA720 through an Ethernet connection can be saved to the PC card or shared over a network. In addition, measurement conditions can be set and controls such as starting and stopping measurements can be entered over the network when an Ethernet connection is used.
A new, High-Speed, Multifunctional Addition to the TA Series

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Continuous Measurement at up to 80 MS/s and Inter-Symbol Interference Analysis with Dual Measurement

The TA720 Time Interval Analyzer has larger memory capacity and is faster than the highly regarded TA520 and TA320. It has a maximum sampling rate of 80 MS/s, and maximum memory capacity of 1024 k samples (in Time stamp mode). In addition, the TA720 has a variety of completely new functions, such as a dual measurement function, inter-symbol interference analysis function, and an optional Ethernet and PC card interface. This time interval analyzer is the ideal analysis tool for jitter analysis of high-speed optical disk signals and recording characteristic evaluations.

  • High-Speed Continuous Measurement at up to 80 MS/s
    The TA720 can continuously measure signals as fast as eight times DVD speed. It continuously measures high-speed signals from sources such as fast-rotating CDs and DVDs, and next-generation optical disks without dropping measurements. This makes accurate jitter analysis possible.
  • Dual Measurement Function
    This function enables two measurements to be done simultaneously. The available measurement combinations are Period A & Period B, Period A & A-to-B time interval, Pulse A & Pulse B, and Pulse A & A-to-B time interval. During optical disk jitter measurement, for example, it is possible to perform two types of jitter measurements (data-data jitter and data-clock jitter).
  • Inter-Symbol Interference Analysis Function
    With this function, it is possible to extract and analyze data corresponding to set code conditions (such as all T spaces between 3T marks). The distribution of the extracted data and related statistics can also be displayed and compared against all of the data at the same time. When combined with the dual measurement function, the inter-symbol interference analysis function enables even faster jitter analysis through techniques such as extracting data-clock data using pulse width as a condition.
  • Ethernet and PC Card Interface (optional)
    Data transmitted to the TA720 through an Ethernet connection can be saved to the PC card or shared over a network. In addition, measurement conditions can be set and controls such as starting and stopping measurements can be entered over the network when an Ethernet connection is used.

Meeting the Needs of Developers in the Optical Disk Market

The TA720 has a variety of functions that are useful in optical disk jitter measurements. These functions can be combined for even greater efficiency in jitter measurements.

High-Speed (80 MS/s) Continuous Measurement

The TA720 contains multiple counter circuits with 25 ps resolution. When these circuits are switched at high speed, the TA720 is capable of time measurement at up to 80 MS/s (12.5 ns period; see below). For example, the TA720 can continuously measure 1-7 modulation signals without dropping data, if the minimum 2T pulse width is 12.5 ns or greater. (Note: This does not apply during dual measurement function)








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Dual Measurement Function

Simultaneous Measurement of Data-Data Jitter and Data-Clock Jitter

The dual measurement function can be used to simultaneously measure an optical disk's data-data jitter and data-clock jitter. In the past, it was necessary to do these measurements separately, so there was a need for steps such as synchronization using an index signal from a spindle motor as a measurement-start control signal. With the TA720, however, these two measurements can be done simultaneously, so data-data jitter and data-clock jitter from the same measurement area are obtained at the same time. Tm Ta720 05
Example of simultaneous measurement of pulse width and data-clock jitter.

Inter-Symbol Interference Analysis Function

This function extracts data corresponding to specified conditions, such as jitter for each space length immediately following a 3T mark, and jitter in each space length between one 3T mark and another. This data can be used to analyze the effects of the code on jitter.
The inter-symbol interference analysis function is useful for evaluating recording strategies, such as recording power control and phase control, and recording waveforms. The distribution of the extracted data and related statistics can also be displayed and compared against all of the data at the same time.
Code length settings that can be selected include arbitrary code length (nT), length shorter than a specified code length (NT>), and length longer than a specified code length (NT<). With these settings, for example, it is possible to measure jitter for each space length immediately following marks which are 6T or longer, and jitter following long recording lengths.
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Example of jitter measurement for each space length between 3T Marks




Examples of Pulse Width Data Extraction

Single Combination Between
Extract data immediately
before or immediately after a
specified code length.
Specify consecutive code and
extract data immediately
preceding or following them.
Specify codes preceding and
following the data to be
extracted.
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Data-Clock Time Difference Jitter Analysis Based on Recording Length

Using the Dual Measurement Function and Inter-Symbol Interference Analysis Function in Combination

The inter-symbol interference analysis function can be used in combination with the dual measurement function (Pulse A & A-to-B time interval) to extract data-clock time difference data at each recording length (pulse width).

Examples of data-clock extraction in case of EFM+ data
Data-Clock Data Immediately
Following 3T
Data-Clock Data Immediately
Following 4-14T
Data-Clock Data Excluding 3T
Marks and Spaces
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Tm Ta720 13 Tm Ta720 14 Tm Ta720 15

Simultaneous Display of Pulse Width Bipolarity

The TA720 can simultaneously display histograms and statistics for both the positive and negative pulse widths. Numerical individual jitter values, distributions (difference between average value and ideal value for each pulse width), and the like can be checked while comparing the positive and negative histograms. In addition, it is possible to display bipolar histograms and statistics. Tm Ta720 16

Multi-Window Function

This function allows you preset up to 14 windows for simultaneous analysis and display of histograms and statistics in those windows. During dual measurement function, data-data and data-clock histograms and statistics can be displayed at the same time. In cases where the CAV control is used and the data rate changes according to disk position, the auto-window function is useful for automatically adjusting the window setting. This function provides an Estimated T method, in which the clock period is estimated from the average data signal value; and a Measured T method, in which the clock period is measured from the CHB input signal. The clock period is measured to automatically adjust the window position.
Tm Ta720 17
Example of multi-window
screen simultaneous display
of data-data and data-clock histograms


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Example of multi-window setting screen


For measuring the data part or header part on an optical disk

The TA720 has the following functions for synchronization with the exterior:
  • External Arming
  • External Gate (connector shared with external arming)
  • Inhibit
The inhibit and external arming functions can be used to separate the data part from the header part during jitter measurement. In addition, a block sampling function can be used to divide the internal memory into as many as 1000 blocks (250 blocks during time stamp mode) for data acquisition. In cases where the recording area is small, such as during media material evaluations, the block sampling function can be used to accumulate samples by performing multiple block measurements with a small amount of data in each measurement (block).

Example of Combined Use of External Arming and Block Sampling Functions

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TA720 Screen Display for Various Types of Analysis

Tm Ta720 20
Histogram Display (Half Size)
When the histogram is set to half size, the
statistics display is enlarged.




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List Display
During the time stamp mode, the individual
measurement values and the time elapsed from
the start of measurement are displayed. The
graph is displayed at the same time so detailed
data can be checked while viewing the broader
trend
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Statistics Display
During bipolar pulse width measurement,
statistics for both positive and negative pulse
widths are displayed at the same time.



Tm Ta720 23
Time Variation Display
(Dual Measurement Example Shown)

This display can be used to display and
analyze trends in measurement values
over time. During dual measurement,
it is possible to separately display data
trends for two measurement functions.
Tm Ta720 24
Symbol Search Function
In time stamp mode or Inter-Symbol
Interference analysis mode, as many as four
consecutive symbols (recording length nT) can
be specified to search for data matching the
symbol conditions.
Tm Ta720 25
Jitter and Deviation Graph Display
In this type of display, a histogram display is
shown on top, and a jitter graph, deviation graph,
or statistics list (selected by user) is displayed on
the bottom. This type of display is useful for
evaluating trends for each recording length
nT on an optical disk.

Rear Panel

Tm Ta720 26
  • Ethernet and PC Card Interface (optional)
  • GP-IB Interface (standard feature)
  • Probe Power Jacks (2)
  • 10 MHz Reference Clock I/O
  • Monitor Output: CHA/CHB
  • Gate Output (measurement period timing output)
  • Supply Voltage: 100-200 VAC, 50/60 Hz

Ethernet and PC Card Interface (optional)

The Ethernet and PC card interface let you access the TA720 from a PC through a LAN in order to download data from the TA720's floppy drive or PC card. You can also transfer waveform data and screenshots from the TA720 to the PC for saving.

FTP Client Function

Save Data and Screenshots to a Network Drive

You can save, delete, and copy waveform data and settings on storage media such as the internal floppy drive or a hard drive located on a networked PC or workstation. These operations work the same way as when you handle data on the PC card. In addition, screenshot data can also be saved. The TA720's FTP client function can be used to save, delete, and copy waveform data and settings on PCs and workstations running the FTP server function.

FTP Server Function

Access a Drive on the TA720 from a PC to Download Files from the Internal Floppy Drive or PC Card

You can download files from the TA720's internal floppy drive or PC card to a networked PC or workstation. The TA720's FTP server function can be used by PCs and workstations running the FTP client function.

Setting TA720 Measurement Conditions and Controlling the Start of Measurement

A PC can be used to set measurement conditions on the TA720 and control when measurement starts and stops.







 Tm Ta720 27

The TA720's Ethernet connector is a 10BASE-T connector. Connect it to your network through a hub or router as shown.
Name Description File Type  
Bulletin 7045-OOE Time Interval Analyzer TA720 pdf icon
1.14 MB
Download
Name Description  
Visual Basic Sample Program for TA720 This is a Visual Basic sample program of GP-IB and Ethernet for TA720 y-Link

Shinano Kenshi Co., Ltd.

The electronic instrumentation division develops and manufactures information technology devices, acoustical equipment, and network information tools for CD applications, and sells them worldwide under the PLEXTOR brand name. Within the engineering department, we are developing DVD±R/RW drives and CD-R/RW drives. Tm Ta720 C01
Shinano Kenshi Co., Ltd.
Electronic Equipment Division
Engineering Department
Mr. Naomi Koyama (Left)
Mr. Shinya Kanai, Manager (Right)
We chose the TA720 Time Interval Analyzer for its high sampling speed and intersymbol interference analysis functions. The playback and recording speeds of CDs and DVDs gets faster with every new generation of products, so we needed a time interval analyzer with a sampling speed that could keep space. Also, thanks to its intersymbol analysis functions, we can measure, even at high recording speeds, the length of the spaces occurring after marks as well as the effects of the interference from those spaces. When we set the widths of the marks and evaluate the recording performance, we use the intersymbol analysis function to measure the jitter distribution of binary signals. Evaluation of recorded disks during the development stage involves establishing recording conditions by using the TA720 to confirm waveforms during magnetic recording. The final evaluation is done on an evaluation tester, and this setup has shortened our development times and given us improved efficiency overall. The TA can display both marks and spaces, so it's very easy for us to visually compare the relationship between the two. For disk rotation jitter analysis, we use the TA720 with its high speed and ability to take a large number of samples.

Visit the Shinano Kenshi, Co., Ltd. web site.
Visit the Plextor Corp. web site.

Media Tek Inc. - Hsin-Chu City Taiwan

MediaTek Incorporated is a dynamic fabless IC company. Since its establishment in 1997, MediaTek has dedicated substantial resources to research and development of comprehensive digital media integrated chipset solutions. MediaTek has now become one of the world's largest fabless IC companies.

Currently, MediaTek's IC products that are on offer include chipsets for CD-ROM, DVD-ROM, CD-R/RW and DVD- R/RW drives for PCs and other consumer products such as DVD players and DVD recorders.

Testing and measuring instruments are very important tool used by engineers to develop optical storage devices. They must be highly accurate and stable, and match the special conditions of our experiments. Each R&D engineer has one set of measuring instruments, and in order to obtain identical results for all experiments, R&D groups must be very careful to choose measuring instruments of excellent quality.

In the photographs below, we are using the TA720 Time Interval Analyzer to perform analysis of jitter and inter symbol interference. The Yokogawa TA720 is alo an excellent instrument for this application.




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Mr. Allen Chen, Deputy director system development div., Digital Consumer BU MediaTek Inc.

LG Electronics Inc.

LG Electronics focuses mainly on the three areas of optical storage, digital AV, and mobile internet appliances, and is working hard to improve its technology and product development capabilities. In particular, LG's level of technology in the area of optical storage has become very high during the past several years, and we are now using that technology to design and manufacture world-leading products. Recently, our company debuted the Super-Multi DVD Writer (model GSA-4040B) which is the first such device in the world that can support the DVD-RAM, -RW, and +RW formats. The Super-Multi DVD Writer allows users to freely play back, record, and edit large quantities of data on a DVD, which holds  Tm Testimo 03
LG Digital Media Research Center

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Data Storage Group
Yokogawa has a very close relationship with LG, and supplied us with high quality measuring equipment which became very popular and trusted tools in both our R&D department and manufacturing lines. For our digital display and media products, we are using ten of the TA520 /TA720 Time Interval Analyzers, and eighty of the DL7440/DL7480 , DL1740, and DL1620 Digital Oscilloscopes. For digital appliances, we have brought in two hundred of the WT series power meters, and about one hundred of the Darwin series of hybrid recorders.
Tm Testimo 05 In the photographs above, we are using the DL7480 during evaluation of DVD recording to measure the recorded signals and focus error signals, and the TA520 to perform analysis of jitter and intersymbol interference.

 

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