MEASUREMENT OF THE STATIC CHARACTERISTICS OF THREE-TERMINAL SEMICONDUCTER DEVICES (TRANSISTORS, FETS, ETC.)
Measurement of the Static Characteristics of Three-Terminal Semiconductor Devices (Transistors, FETs, etc.)
The GS820 can measure drain current ID by applying gate-source voltage VGS from channel 1 and drain-source voltage VDS from channel 2.
Generators, Sources
For general purpose standalone applications or as core components in a high speed test and measurement system, Yokogawa sources and signal generators are highly accurate and functional.
