Key features of the AQ6377 optical spectrum analyzer include gas purging input ports/output ports, a built-in cut filter for high order diffracted light, and a novel double speed mode which increases the sweep speed up to 2 times compared to the standard sweep mode.
Wavelength range: 1900 to 5500 nm
Wavelength resolution settings: 0.2 to 5 nm
Wavelength accuracy: ±0.5 nm
Level range: −60 to +13 dBm
Dynamic range: 50 dB
Measurement example of 4.3 μm DFB laser
(Res: 0.2 nm, Span: 50 nm)
Due to the high resolution and sensitivity of the AQ6377, it can actually detect the presence of water molecules in the air. The water vapor is detected in the upper Near-IR wavelength region and could overlap with or mask the spectral characteristics of the actual device under test in that particular region.
By continuously supplying a pure purge gas such as nitrogen to the monochromator through the ports on the back panel, the AQ6377 can reduce the influence of water vapor absorptions and provide more reliable and accurate measurements than ever before.
Due to the diffractive technology used, the monochromator in some circumstances could generate high order diffracted light, which appears at wavelengths equal to the integral multiple of input wavelengths.
By cutting incoming light below 1500 nm with the built-in filter, the AQ6377 drastically reduces the influence of high order diffracted light on the measurement. Thus, the measured data are always reliable and replicate the real signal under test.
Increases the sweep speed up to 2 times compared to the standard sweep mode, with only a 2 dB penalty to the standard sensitivity value.
The AQ6377 uses a free-space optical input structure (i.e. no fiber is mounted inside the instrument), most effective for guaranteeing high coupling efficiency, measurement repeatability, and no maintenance.
This smart solution is:
Data Logging Function
Records analysis results such as distributed feedback laser diode (DFB-LD) analysis data and multi-peak measurements at up to 10,000 points per channel with time stamps.
Advanced Marker Function
Adds markers to obtain the power spectral density and the integrated power of a designated spectrum. This new feature makes it easy to get an OSNR value of the signal, whether modulated or not, directly from its spectrum.
Building Automated Test Systems
Thanks to the built-in Macro Programming Function, all AQ6370 Series models can perform automatic measurements and control external equipment through their remote interfaces.
GP-IB, RS-232 and Ethernet ports enable the instrument to be remotely controlled by a PC using standard SCPI-compatible or proprietary AQ6317-compatible commands. LabVIEW® drivers are also available.
Built-in Calibration Source
Ambient temperature change, vibrations, and shock affect the measurement accuracy of high precision products such as optical spectrum analyzers. Yokogawa OSAs must be able to deliver the precise measurements for which they were designed; therefore, our instruments are equipped with a light source for calibration.
The calibration process is fully automatic and takes only 2 minutes to complete. It includes:
Spectrum Width Analysis
You can display the spectrum width and center wavelength using the following 4 types of calculation:
Notch Width Measurement
With this function it is possible to measure pass bandwidth / notch width from the measured waveform of a filter with V-type or U-type wavelength characteristics.
Light Source Analysis
Light source parameters can be analyzed from the measured waveform of each type of light source among DFB-LD, FP-LD and LED.PMD Measurement
It is possible to measure the Polarization Mode Dispersion (PMD) of a DUT (such as an optical fiber) by using the instrument in combination with an Analyzer, Polarization Controller, Polarizer, and an Amplified Spontaneous Emission (ASE) light source, High-output LED light source, or other wideband light source.
WDM (OSNR) Analysis
With this function it is easy to analyze WDM transmission signals. You can also measure OSNR of a DWDM transmission system with 50 GHz spacing. Measurements of WDM signal wavelength, level, wavelength interval, and OSNR can be made collectively on up to 1024 channels, and the analysis results can be displayed in a data table.
Optical Amp Analysis
Gain and Noise figure measurements can be made on signal light waveforms going into optical amplifiers, as well as light leaving the optical amplifiers.
Optical Filter Characteristics Measurement
Optical filter characteristics can be measured from the measured waveforms of the light, from source, going into optical filters, as well as from the measured waveforms of light being output from optical filters. Analysis can be performed not only on optical filters with one mode, but also multimode filters (e.g WDM Filters).
Measurement of Level Fluctuations in Single-Wavelength Light
This function is used to measure changes over time in the level of a specific wavelength level. The sweep width is set to 0 nm, and measurement of the single-wavelength light is taken. The horizontal axis is the time axes. It is useful for purposes such as optical axis alignment when a light source is input to an optical fiber.
The template function compares preset reference data (template data) with a measured waveform. In addition, if a function for displaying the target spectrum (target line) on the measurement screen is used, the target spectrum can be referenced while adjusting the optical axis of an optical device.
Go/No Go Judgment
The Go/No Go test function compares the active trace waveform against reference data (template data) preset by the user, and performs a test on the measured waveform (Go/No Go test).
This function can be used effectively in situations such as pass/fail tests on production lines.
Analysis between Line Markers / in the Zoom Area
The instruments perform the analysis of the signal contained into boundaries selected by means of line markers or zoomed area.
RACK MOUNTING KIT For an EIA-compliant Single-housing Rack
To accurately measure pulsed light using an optical spectrum analyzer (OSA), it is necessary to understand the characteristics of the OSA and select the appropriate measurement method and settings.
The extreme test requirements of our research called for an OSA with extended MIR spectrum bandwidth capabilities up to 5μm, but we couldn’t find one on the market capable of measuring optical inputs at these wavelengths. Yokogawa Test&Measurement rose to the challenge and developed a new OSA model for us that would. Not only do we now have an instrument that is practically custom-made for our needs, it provides repeatable, accurate, and trusted measurement outputs and is easy to learn and use. Their equipment and ability to create a new optical measurement solution has definitely increased the overall efficiency and productivity of our research team.
— Martin Bernier, PhD, P.Eng., Full Professor, Centre de Optique, Photonique, et Laser, Université Laval
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