AQ6150 SERIES OPTICAL WAVELENGTH METER
The AQ6150 Series Optical Wavelength Meter is an ideal instrument for accurately measuring the optical wavelength of optical devices and systems used in telecommunication applications from 1270 to 1650 nm (including C&L Band). By employing a Michelson interferometer and a high speed Fast Fourier Transform (FFT) algorithm, the AQ6150 series can measure not only a single wavelength laser signal, but also a multiple wavelength laser signal from a DWDM system and Fabry-Perot laser. Furthermore, this technology enables the measurement of modulated laser signals in addition to the CW signal from an optical transceiver. The optimized optical design and data processing routine significantly reduces the measurement time and improves manufacturing throughout.
High wavelength accuracy of ±0.3pm
The real-time correction feature utilizes a highly stable reference signal from the built-in wavelength reference light source in order to provide long-term stability for each measurement taken.
The high accuracy AQ6151 model offers an accuracy of ±0.3pm to meet the most demanding precision requirements.
The standard accuracy AQ6150 offers a ±1pm accuracy for applications with less demanding requirements at a more affordable price.
Cope with modulated light and optical filter measurement
The optical output of optical transceivers and optical transmission systems is modulated with a transmission frequency like 10G and 40Gbps. The built-in Optical Spectrum Analysis capability utilizing an FFT technique is required to measure the spectrum broadened by the modulated signal.
In addition to the regular CW light mode, the AQ6150 Series has a modulated light mode. The modulated mode analyzes the optical spectrum and returns the center wavelength of the modulated light from the transceiver. This mode can also be used for the center wavelength measurement of optical filters such as a band pass filter, AWG and WSS.
Simultaneous measurement of up to 1024 wavelengths
Measure up to 1024 wavelengths in a single input signal with a minimum separation of 5GHz simultaneously, quickly, and accurately. This means the AQ6150 Series optical wavelength meters can meet testing needs in the development and production of WDM transmission system today, as well as in the future.
The multi-wavelength measurement capability contributes to production efficiency and cost reduction in the production of single wavelength laser devices as well by combining multiple laser modules or optical transceivers using an optical coupler and measuring all the signals at once.
Maintain high performance even with low-power input
Equipped with an Auto Gain Control (AGC) function, the AQ6150 Series adjusts the gain of the electrical amplifier automatically based on the input signal power. This helps maximize wavelength accuracy and measurement speed, even if the input signal power is as low as -40 dBm.
Increase throughput with high speed measurement
For the adjustment and characterization of tunable laser sources and tunable optical transceivers requiring hundreds of wavelength measurements per device, high-speed measurement and processing capability are crucial for improving the production throughput. Both models can acquire, analyze, and transfer a measurement to a PC within 0.3 seconds. This is 5 times faster than our conventional model, vastly improving production throughput. In the Repeat Measurement mode, the AQ6150 series can collect 5 measurements per second, making it extremely useful when adjusting a device while monitoring the wavelength in real time.
|Easy to view bright color LCD||
|Direct operation with mouse||
|Data access through LAN||The standard LAN port allows convenient access to files stored in the internal memory as well as the ability to remotely update the firmware from a PC.|
Reduce the lifetime ownership cost
With the conventional wavelength meter, the high failure rate of the wavelength reference light source and its high replacement costs have been a major contribution to the overall ownership costs over a product life.
One of the key product design goals was to address these issues. This was achieved by a multi-dimensional approach, giving the AQ6150 Series the ability to extend the service life of the light source and by reduce the overall replacement cost of the unit.
|Measurement||Single, repeat, average, drift
|Measurement condition setup||Average count, air/vacuum wavelength, device type (CQ/modulated,), measurement range|
|Display||Single wavelength, multi-wavelength, delta, spectrum, wavelength axis units, optical power units, center wavelength, total power, marker, label, power bar, warning messages, error messages, system information.|
|Data analysis||Peak search, FP-LD analysis, drift analysis|
|File||Saving/loading measured results (CSV), saving/loading parameters (binary), saving screen images (BMP)|
|Remote control||Interface selection (GP-IB/Ethernet), TCP/IP configuration, remote monitor|
|Others||Internal reference light source on/off, internal reference light source status LED, optical power offset, parameter initialization, firmware updating|
Various view modes
|Single Wavelength Mode||The single wavelength mode displays the wavelength and power of the highest peak or an arbitrary peak using large easy to read numbers. This allows the values to be easily read even if the unit is places at the top of the test strand|
|Multi Wavelength Mode||The multi wavelength mode displays a list of wavelength and power of multiple peaks with the wavelength and power of the highest peak or an arbitrary peak on top of the list. There is also a mode to show the list only to maximize the number of channels shown on the screen.|
|Delta Wavelength Mode||The delta wavelength mode calculates and displays he difference between a reference peak and the other peaks in terms of wavelength and power. This mode helps determine the peak spacing.|
|Optical Spectrum View||The AQ6250 series can display an optical spectrum waveform obtained from a Fast Fourier Transform (FFT) algorithm. It allows for determining test conditions and troubleshooting an error in the measurement while confirming the actual spectrum.|
Efficient measurement & analysis functions
The AQ6150 series is equipped with automatic measurement and analysis functions. These functions save valuable time and resources from creating/validating remote control and analysis programs.
|Drift Analysis||The drift analysis measures the variation of wavelength and power for each peak over time by repeating the measurement. It obtains maximum value (MAX), minimum value (MIN), and variation (MAX-MIN). This function is useful for long-term stability testing and evaluation the temperature dependency of lasers.|
|Average measurement||The average measurement obtains an average wavelength and power for each peak by repeating the measurement. This function helps uncertainty of measurement for a modulated signal or unstable signals.|
|Fabry-Perot laser analysis||The evaluation parameters of a Fabry-Perot laser can be analyzed and displayed instantly from the measured optical spectrum.|
WDM transmission systems
In WDM transmission system testing, high wavelength accuracy is required for testing the system's internal circuit boards such as laser modules and optical transceivers as well as the final output signal of the system.
Testing of optical components used in WDM transmission systems such as laser devices, laser modules, and optical transceivers also require high wavelength accuracy.
Calibration of test systems
Due to the high accuracy of the AQ6150 Series, it can be used for precision wavelength calibration applications such as:
Generate interference by changing the optical path length difference between the fixed mirror and the movable mirror, then detect the interference signal with the optical receiver.
Fast Fourier transform
Convert the interface signal into an optical spectrum waveform.
Fast data processing
Analyze the given optical spectrum waveform, then output the wavelength and power data of the input signal.
Real-time wavelength correction
Correct the measurement error by simultaneously measuring the interference signal of the reference wavelength while measuring the input signal.
|AQ6150||AQ6150 Optical Wavelength Meter|
|AQ6151||AQ6151 Optical Wavelength Meter|
|AQ6150 Series Bulletin||Bulletin for the AQ6150 Series||