AQ2300 Series Test Platform

Source and Measurement Functions

Accommodate different function combinations for each channel in each slot:

• Voltage or Current
• Generation or Measurement
• Generation and Measurement

Static characterization of laser diode (LD) and photodiode modules

The AQ2300 streamlines the test by synchronizing source measure unit (SMU) and optical power meter (OPM) measurements during sweep measurements in a single test platform. enabling electrical and optical parameters to be synchronously acquired in a single platform. This built-in inter-channel synchronization enables efficient I-L characterization without additional external synchronization wiring. For more comprehensive optical characterization, the measurement system can be integrated with the AQ6151B Optical Wavelength Meter and AQ6361/AQ6370E Optical Spectrum Analyzer to evaluate wavelength and spectrum alongside electrical and optical power characteristics.

[Measurement items] I-L measurement, DC extinction ratio, PD current, modulator current, wavelength, spectrum

Optical transceiver measurements

The AQ2300 provides comprehensive optical transceiver evaluation by combining optical power measurement, optical attenuation, optical path switching, and ASE noise loading within a modular system. Multiple transceiver channels can be routed through optical switches, while variable optical attenuators enable controlled adjustment of optical signal levels. When combined with the AQ6151B Optical Wavelength Meter and the AQ6361/AQ6370E Optical Spectrum Analyzer, the system also delivers comprehensive wavelength and spectral analysis. The AQ23191A ASE Light Source can also be incorporated into the optical path to evaluate transceiver performance under controlled ASE noise-loading conditions.

[Measurement items] Optical power, wavelength, Spectrum, optical power adjustment, ASE noise loading

Optical Fiber Amplifier Measurements

The AQ2300 supports optical fiber amplifier evaluation under wavelength-division multiplexed (WDM) conditions. Multiple optical signals at different wavelengths can be independently controlled, attenuated, and multiplexed to create realistic inputs for the amplifier under test. Combined with the AQ6370E/AQ6361 Optical Spectrum Analyzer, the system can evaluate gain, gain flatness, noise figure, and ASE across multiple wavelength channels. The AQ6370E/AQ6361 provides dedicated optical amplifier analysis capabilities for gain and noise figure evaluation, while the AQ2300 enables flexible control of optical power levels and measurement paths for multi-wavelength testing.

[Measurement items] Gain, gain flatness, noise figure, ASE noise

Loss measurement of optical passive components

The AQ2300 supports measurement of optical loss measurements for passive components such as optical fibers, connectors, couplers, etc. By combining optical sources, power meters, attenuators and switching modules in single modular system, engineers can evaluate the optical insertion loss and crosstalk of various optical passive components.

[Measurement items] Optical insertion loss, crosstalk

MPO component inspection system

The AQ2300 can be combined with the AQ7420 or AQ7421 High-Resolution Reflectometer to build a multi-fiber inspection system for MPO and multi-fiber optical components. Optical switches route the measurement path across multiple fibers, enabling insertion loss and optical return loss measurements in a multi-channel configuration. The AQ7420 and AQ7421 provide high-resolution reflection analysis to identify the position and magnitude of localized reflections, helping detect defects such as micro-cracks that may be difficult to identify through conventional loss measurements alone. By combining this detailed reflection analysis with the AQ2300's flexible optical switching and power measurement capabilities, the system supports comprehensive evaluation of insertion loss, total and partial optical return loss, and micro-cracks in MPO components.

[Measurement items] Insertion loss, total optical return loss, partial optical return loss, micro-crack detection

High-speed sweep testing of multi-power-supply optical devices

The AQ2300 enables high-speed synchronized sweep measurements for devices with multiple electrical signals. By taking advantage of the AQ2300’s internal trigger and inter-channel synchronization, the system simplifies sweep testing to evaluate optimal voltage and current conditions and characterize optical power variation across multiple electrical operating parameters.

[Measurement items] Searching for optimal voltage or current conditions, optical power variation

Connection Interfaces

AQ2300 Series Manufacturing Test Platform Models