AQ23811A Source Measure Unit (±6 V / ±600 mA)

The AQ23811A Source Measure Unit is ideal for testing semiconductor devices with low-to-medium currents and can be expanded up to 18 channels with a 9-slot frame.

  • Source & Measure: ±6 V / ±600 mA
  • Sink & Measure: ±6 V / ±200 mA 
             ±2 V / ±600 mA
  • 2 channels (1 slot width)
  • DC, Pulse (50 µs to 1 s)
  • External trigger I/O
  • Linear sweep, log sweep, program sweep

The AQ2300 Series SMU can be used for the evaluation and inspection of optical semiconductor components such as LD, PD, LED and modulator, and semiconductor components such as transistors and FET.
 

Static Testing of Laser Diode Module

Generate different voltages or currents from several channels and use the sweep synchronization function to measure the I/V or I/L characteristics of the LD.

Features

  • Synchronization of LD current sweep with PD current measurement and optical power measurement
  • Microcurrent measurement with a minimum resolution of 1 pA (200 nA range)
  • Measurement data format in CSV or binary format
  • Digital I/O interface supports SMU operation start and end response communication

Laser Diode Modules Static Testing | AQ23811A Source Measure Unit | Yokogawa Test&Measurement

Filter Characteristic Tests of WDM Photodiode Modules

Generate different voltages or currents from several wavelength division multiplexing (WDM) channels and use the sweep synchronization function to measure filter characteristics of each individual channel.

Features

  • Synchronization of wavelength sweep and amplifier IC current measurement
  • Microcurrent measurement with a minimum resolution of 1 pA (200 nA range)
  • Measurement data format in CSV or binary format

WDM Photodiode Modules Filter Characteristic Tests | AQ23811A Source Measure Unit | Yokogawa Test&Measurement

Covers Applications from R&D to Production

Frame and SMU Features

The frames are available in 3-slot or 9-slot types and can be flexibly adapted to small and medium-sized measurement systems.

  • Expandable up to 18 channels with 2-channel SMU
  • Digital I/O interface can be selected
  • 3-trigger synchronization systems
  • Simultaneous measurement of voltage and current possible
  • Simplified response adjustment
  • High-speed data transfer
  • Measurement data storage up to 100 k points per channel
  • Channel-to-channel and module-to-module isolation
  • Hot swappable modules
     

Digital I/O (Factory Option)

Receives the start-of-operation signal from external equipment and sends the end-of-operation signal to external equipment.
 

Digital I/O Interface Port Configurations

Digital I/O Interface Port Configurations | AQ23811A Source Measure Unit | Yokogawa Test&Measurement

Save polling operations to monitor the timing of voltage or current generation start and end.
 

Various Trigger Synchronization Functions

The AQ2300 series SMU have trigger ports not only on the frame side, but also on each channel of the SMU. In addition, in-frame synchronization functionality is also provided, allowing flexible selection of the connection method.

Synchronize Frame with External Equipment | AQ23811A Source Measure Unit | Yokogawa Test&Measurement
Synchronize Frame with External Equipment


Synchronize Channel with External Equipment | AQ23811A Source Measure Unit | Yokogawa Test&Measurement
Synchronize Channel with External Equipment


Synchronize SMU Channels | AQ23811A Source Measure Unit | Yokogawa Test&Measurement
Synchronize SMU Channels

More Optimized Response Adjustments

The AQ2300 SMU can be adjusted to reduce rising edge overshoot and ripple. These can be made easily by entering the R, L, and C values for the load.

Optimized Response Adjustments | AQ23811A Source Measure Unit | Yokogawa Test&Measurement

High-Quality Pulse Generation and Measurement

The AQ2300 Series SMU can generate high-quality pulse signals with the response adjustment function and digital feedback technology.

  • Minimum Pulse Width: 50 μs
  • Minimum Cycle: 100 μs

High-Quality Pulse Generation and Measurement | AQ23811A Source Measure Unit | Yokogawa Test&Measurement

Faster Data Transmission Speeds

Reduce the time between measurements for significantly improved operational efficiency.

Faster Data Transmission Speeds | AQ23811A Source Measure Unit | Yokogawa Test&Measurement

Fewer Measurement Segments

Store measurement data up to 100 k points per channel to reduce the number of measurement segments or files.

Fewer Measurement Divisions | AQ23811A Source Measure Unit | Yokogawa Test&Measurement

Specifications

AQ23811A Source Measure Unit Specs | Yokogawa Test&Measurement

AQ23811A Source Measure Unit Specs | Yokogawa Test&Measurement
Note: If the integration time is less than 1 PLC, an additional value must be added. See manual for details.

AQ23811A Source Measure Unit Specs | Yokogawa Test&Measurement

Source and Measurement Functions

Accommodate different function combinations for each channel in each slot:

  • Voltage or Current
  • Generation or Measurement
  • Generation and Measurement

Source and Measurement Functions | AQ23811A Source Measure Unit | Yokogawa Test&Measurement

Source and Measurement Timing

Generate and measure starting from a trigger input such as an internal timer or external input signal. Generation begins after source delay time has elapsed, and measurement is performed with a set integration time when the measure delay time has elapsed. This allows measurements to be taken while avoiding the unstable timing immediately after an output change.

Source and Measurement Timing | AQ23811A Source Measure Unit | Yokogawa Test&Measurement

Sweep

SMU output waveforms are available in DC and pulse, with continuous output, linear sweep, log sweep, and program sweep.

Sweep | AQ23811A Source Measure Unit | Yokogawa Test&Measurement

Drawings

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