AQ23811A Source Measure Unit (±6 V / ±600 mA)
Dual-Channel Voltage and Current Sourcing and Measurement for Optical and Semiconductor Devices
The AQ23811A is a two-channel source measure unit module for the AQ2300 Series Test Platform. It combines voltage and current generation with voltage and current measurement, allowing electrical characteristics to be evaluated using a single compact module.
The AQ23811A is designed for the evaluation and inspection of optical semiconductor devices such as laser diodes, photodiodes, LEDs, and optical modulators, as well as electronic semiconductor devices such as transistors and FETs. A nine-slot AQ2300 frame can accommodate up to 18 SMU channels.
Key Specifications
- Source & Measure: ±6 V / ±600 mA
- Sink & Measure: ±6 V / ±200 mA
±2 V / ±600 mA - 2 channels (1 slot width)
- DC, Pulse (50 µs to 1 s)
- External trigger I/O
- Linear sweep, log sweep, program sweep
Static Testing of Laser Diode Module
Generate different voltages or currents from several channels and use the sweep synchronization function to measure the I/V or I/L characteristics of the LD.
Features
- Synchronization of LD current sweep with PD current measurement and optical power measurement
- Microcurrent measurement with a minimum resolution of 1 pA (200 nA range)
- Measurement data format in CSV or binary format
- Digital I/O interface supports SMU operation start and end response communication
Filter Characteristic Tests of WDM Photodiode Modules
Generate different voltages or currents from several wavelength division multiplexing (WDM) channels and use the sweep synchronization function to measure filter characteristics of each individual channel.
Features
- Synchronization of wavelength sweep and amplifier IC current measurement
- Microcurrent measurement with a minimum resolution of 1 pA (200 nA range)
- Measurement data format in CSV or binary format
Covers Applications from R&D to Production
Frame and SMU Features
The frames are available in 3-slot or 9-slot types and can be flexibly adapted to small and medium-sized measurement systems.
- Expandable up to 18 channels with 2-channel SMU
- Digital I/O interface can be selected
- 3-trigger synchronization systems
- Simultaneous measurement of voltage and current possible
- Simplified response adjustment
- High-speed data transfer
- Measurement data storage up to 100 k points per channel
- Channel-to-channel and module-to-module isolation
- Hot swappable modules
Digital I/O (Factory Option)
Receives the start-of-operation signal from external equipment and sends the end-of-operation signal to external equipment.
Digital I/O Interface Port Configurations
Save polling operations to monitor the timing of voltage or current generation start and end.
Various Trigger Synchronization Functions
The AQ2300 series SMU have trigger ports not only on the frame side, but also on each channel of the SMU. In addition, in-frame synchronization functionality is also provided, allowing flexible selection of the connection method.
Synchronize Frame with External Equipment
Synchronize Channel with External Equipment
Synchronize SMU Channels
More Optimized Response Adjustments
The AQ2300 SMU can be adjusted to reduce rising edge overshoot and ripple. These can be made easily by entering the R, L, and C values for the load.
High-Quality Pulse Generation and Measurement
The AQ2300 Series SMU can generate high-quality pulse signals with the response adjustment function and digital feedback technology.
- Minimum Pulse Width: 50 μs
- Minimum Cycle: 100 μs
Faster Data Transmission Speeds
Reduce the time between measurements for significantly improved operational efficiency.
Fewer Measurement Segments
Store measurement data up to 100 k points per channel to reduce the number of measurement segments or files.
Specifications
Current Limiter
| |Setting|*3 | Range | Resolution | |Min. Setting|*4 |
|---|---|---|---|
| 10.000 nA to 200.000 nA | 200 nA | 1 pA | 10 nA |
| 0.20001 µA to 2.00000 µA | 2 µA | 10 pA | 10 nA |
| 2.0001 µA to 20.0000 µA | 20 µA | 100 pA | 100 nA |
| 20.001 µA to 200.000 µA | 200 µA | 1 nA | 1 µA |
| 0.20001 mA to 2.00000 mA | 2 mA | 10 nA | 10 µA |
| 2.0001 mA to 20.0000 mA | 20 mA | 100 nA | 100 µA |
| 20.001 mA to 200.000 mA | 200 mA | 1 µA | 1mA |
| 200.01 mA to 600 mA | 600 mA | 10 µA | 1mA |
*3: The current range is determined by the greater of the High and Low limiters.
*4: Minimum setting when tracking is OFF.
Voltage Limiter
| |Setting| | Range | Resolution | |Min. Setting| |
|---|---|---|---|
| 0.0060 V to 6.0000 V | 6 V | 100 µV | 5 mV |
Maximum capacity/Inductive Load*5
| Capacity Load | Inductive Load |
|---|---|
| 100 µF | 10 µH |
*5: Response adjustments may be required.
Output Noise (Typical)
| 20 mVp-p | For 10 Hz to 20 MHz, 6 V Voltage source range, Output liberation |
Response time (Typical)
| Voltage Range |
Limit Setting |
Response Time*6 |
Load Conditions | RC Setting | ||
|---|---|---|---|---|---|---|
| R | C | R | C | |||
| 6 V | ±200 nA | 2.5 ms | >1 GΩ | 25 pF | 100 MΩ | 25 pF |
| ±2 µA | 0.5 ms | |||||
| ±20 µA | 50 µs | |||||
| ±200 µA | 10 µs | |||||
| ±2 mA | ||||||
| ±20 mA | ||||||
| ±200 mA | ||||||
| ±600 mA | ||||||
*6: Time from the start of the output voltage change to within 0.1% of the final value when the output voltage is varied from 0 V to 6 V.
| Current Range |
Limit Setting |
Response Time*7 |
Load Conditions | RL Setting | ||
|---|---|---|---|---|---|---|
| R | L | R | L | |||
| 200 nA | 6 V | 150 µs | 1 MΩ | 20 nH | 1 MΩ | 20 nH |
| 2 µA | 100 kΩ | 100 kΩ | ||||
| 20 µA | 20 µs | 10 kΩ | 10 kΩ | |||
| 200 µA | 1 kΩ | 1kΩ | ||||
| 2 mA | 100 Ω | 100 Ω | ||||
| 20 mA | 15 µs | 10 Ω | 10 Ω | |||
| 200 mA | 1 Ω | 200 nH | 1 Ω | 200 nH | ||
| 600 mA | ||||||
*7: The time from the beginning of the change to within 0.1% of the final value when the output current is varied from 0 A to the full scale current of the set range.
DC Voltage Measurement
| Range | Measurement Range | Resolution | — | Accuracy ±(% of reading + V) | Temperature Coefficient ±(% of reading + V)/°C |
|---|---|---|---|---|---|
| 6 V | ±6.3000 V | 100 µV | — | 0.02 + 500 µV | 0.002 + 30 µV |
DC Current Measurement
| Range | Measurement Range | Resolution | Detection resistance | Accuracy ±(% of reading+A) | Temperature Coefficient ±(% of reading+A)/°C |
|---|---|---|---|---|---|
| 200 nA | ±210.000 nA | 1 pA | 5 MΩ | 0.05 + 100 pA | 0.003 + 5 pA |
| 2 µA | ±2.10000 µA | 10 pA | 1 MΩ | 0.04 + 300 pA | 0.002 + 20 pA |
| 20 µA | ±21.0000 µA | 100 pA | 100 kΩ | 0.03 + 3 nA | 0.002 + 200 pA |
| 200 µA | ±210.000 µA | 1 nA | 10 kΩ | 0.03 + 30 nA | 0.002 + 2 nA |
| 2 mA | ±2.10000 mA | 10 nA | 1 kΩ | 0.03 + 300 nA | 0.002 + 20 nA |
| 20 mA | ±21.0000 mA | 100 nA | 100 Ω | 0.03 + 3 µA | 0.002 + 200 nA |
| 200 mA | ±210.000 mA | 1 µA | 10 Ω | 0.03 + 30 µA | 0.002 + 2 µA |
| 600 mA | ±630.00 mA | 10 µA | 1 Ω | 0.05 + 300 µA | 0.003 + 10 µA |
Note: If the integration time is less than 1 PLC, an additional value must be added. See manual for details.
Source and Measurement Functions
Accommodate different function combinations for each channel in each slot:
- Voltage or Current
- Generation or Measurement
- Generation and Measurement
Source and Measurement Timing
Generate and measure starting from a trigger input such as an internal timer or external input signal. Generation begins after source delay time has elapsed, and measurement is performed with a set integration time when the measure delay time has elapsed. This allows measurements to be taken while avoiding the unstable timing immediately after an output change.
Sweep
SMU output waveforms are available in DC and pulse, with continuous output, linear sweep, log sweep, and program sweep.
Brochures
Instruction Manuals
- Model AQ23811A Checking the Contents of the Package and Handling Precautions of the Modules (755.8 KB)
- AQ23011A, AQ23012A Frame Getting Started Guide(with supplement) (8.6 MB)
Drawings
- AQ23811A Source Measure Unit (494.9 KB)
