Yokogawa Test&Measurement Releases AQ2300 Series Modular High-Precision SMU to Expedite the Development of Semiconductor Devices

Yokogawa Test & Measurement Corporation

Amersfoort, The Netherlands – 5/12/ 2024

 

Yokogawa Test&Measurement Releases AQ2300 Series Modular High-Precision SMU to Expedite the Development of Semiconductor Devices

 

Yokogawa Test & Measurement Corporation announces the release of its AQ2300 high-performance, high-speed SMU (Source Measure Unit) into the European marketplace. Addressing various density needs for semiconductor/communication devices, the AQ2300 series modular SMU offers high-quality pulse generation alongside high-precision voltage/current generation and measurements. Thanks to its inherent productivity and expandability characteristics, the 2-channel SMU module also saves time and space when performing the typically complex measurement functions essential for semiconductor devices.

Yokogawa’s AQ2300  series modular high-precision SMU

 

Development Background

The proliferation of smartphones and tablets, the rise of AI, and the expansion of autonomous vehicles is increasing the need for communication infrastructure to enhance speeds and address future power demands. For laser devices in particular, engineers must undertake accurate sourcing of the mainly current signals that optimize laser control, adjusting the inputs accordingly to measure the precise output of laser light. Yokogawa therefore set about developing its new AQ2300 series SMU with high levels of precision, functionality and modularity to keep pace with the miniaturization of next-generation devices and the increasing complexity of measurements required for R&D evaluation.

Main Features

The highly modular AQ2300-Series SMU allows users to select the number of channels required (up to 18) to meet system needs within a limited space, supporting efficient facility operation.

 

High-quality pulse waveform generation (50 μs-width) is also an important feature. This function suppresses the heat generated by the device during testing, making more accurate measurements possible. The rise and fall times may be disturbed due to the device or wiring, but by adjusting the parameter settings, a smooth output waveform can be achieved.

 

Interoperability is a further feature of note. AQ2300 series SMUs have trigger ports not only on the frame side, but also on each SMU channel. Moreover, in-frame synchronization functionality allows flexible selection of the connection method. In total, three trigger synchronization functions are available:

 

• Synchronization of frames with external equipment
• Synchronization of SMU channel with external equipment
• Synchronization between SMU channels.

 

The frame can also feature a digital I/O interface that enables co-operation with external devices. Frames are available in 3-slot or 9-slot types and suit flexible adaptation to small and medium-sized measurement systems. Importantly, the AQ2300 series SMU provides flexible measurement timing control in support of better overall system performance.

 

Regarding productivity, the AQ2300 series offers the ability to perform simultaneous measurements of voltage and current. Furthermore, by accelerating communication within the frame and between a PC, the new SMU fosters elevated levels of work efficiency, where high-speed data transfer reduces the total measurement time and significantly enhances operational efficiency.

 

Major Target Markets

- R&D institutes developing new advances in optical communication devices

- Manufacturers of optical semiconductor components such as laser diodes, photo diodes, LEDs and modulators

- Manufacturers of electrical semiconductor components that include transistors and FETs (field-effect transistors)

 

Applications

- Static testing of laser diode modules: The AQ2300 series SMU can generate different voltages or currents from several channels and use the sweep synchronization function to measure the I/V or I/L characteristics of optical communication devices like laser diodes. It can also perform wavelength-I measurements on photo diodes in synchronization with a tunable light source.

- Filter characteristic testing of WDM (wavelength division multiplexing) photo-diode modules: The AQ2300 series SMU can generate different voltages or currents from several WDM channels and use the sweep synchronization function to measure the filter characteristics of each individual channel

 

For More Information

AQ2300 series AQ23811A Source Measure Unit (±6 V / ±600 mA) | Yokogawa Test&Measurement Corporation

 

About Yokogawa Test&Measurement

Yokogawa has been developing measurement solutions for 100 years, consistently finding new ways to give R&D teams the tools they need to gain the best insights from their measurement strategies. The company has pioneered accurate power measurement throughout its history, and is the market leader in digital power analyzers and optical spectrum analyzers.

 

Yokogawa measuring instruments are renowned worldwide for their high levels of precision, quality, durability, and service support.

 

Meet the precision makers at https://tmi.yokogawa.com/

 

About Yokogawa

Yokogawa provides advanced solutions in the areas of measurement, control, and information to customers across a broad range of industries, including energy, chemicals, materials, pharmaceuticals, and food. Yokogawa addresses customer issues regarding the optimization of production, assets, and the supply chain with the effective application of digital technologies, enabling the transition to autonomous operations.

Founded in Tokyo in 1915, Yokogawa continues to work toward a sustainable society through its 17,000+ employees in a global network of 129 companies spanning 60 countries.

For more information, visit www.yokogawa.com

 

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