The AQ7420 precisely identifies both the location and magnitude of reflections within optical connectors and modules, revealing microcracks or misalignments that standard loss measurements often miss. Unlike conventional OCWR methods, it visualizes previously undetectable defects, helping to prevent unpredictable failures in demanding environments subject to vibration, movement, or thermal cycling.
Compared with OFDR-based reflectometers, the AQ7420 delivers sharper, spurious-free waveforms, making it ideally suited for high-precision inspection. When paired with the optional sensor head unit, it can also measure insertion loss simultaneously, providing a versatile solution for both R&D and production testing.
With some conventional reflectometers, spurious noises may falsely appear in areas where there is no actual reflection. Waveform analysis often requires that users have specialized knowledge of this sort of phenomena. The AQ7420 greatly reduces spurious noises and simplifies analysis.
Traditionally, reflectometers have been inadequate for inspection of reflection attenuation due to poor measurement accuracy of the vertical axis (back reflection). The AQ7420 enables measurement with an uncertainty of ±3dB, and using the optical sensor head, connector connection loss can be measured simultaneously with an uncertainty of ±0.02 dB.
The AQ7420 simultaneously measures breaks, cracks, losses, and reflections of optical connectors.
Measurement example of microcracks in optical connectors (high sensitivity range)