As optical devices become more integrated and complex, even the smallest reflections or misalignments can degrade performance and reliability. Accurate measurement of these parameters is critical, yet conventional reflectometers often introduce spurious noise that complicates analysis.
The High-resolution reflectometer accurately detects the quantity and location of reflections within optical connectors and modules. It reveals microcracks that standard loss measurements might miss, helping to avoid unpredictable and potentially detrimental failures.
Component Position and Reflection Analysis in Optical Devices
With high spatial resolution, spurious-free operation, and sharp waveforms, the AQ7420 and AQ7421 precisely identify component positions inside optical devices and measure the reflected light generated at their edges.
- Spatial resolution: 40 μm
- Spurious noise: −100 dB avoids false detections
- Simultaneous measurement of multiple reflection and insertion loss
- Up to 8 m with optional expander unit
- Spatial resolution: 40 μm
- Spurious noise: −100 dB avoids false detections
- Simultaneous measurement of multiple reflection and insertion loss
Optical Communications & Networks
Precision optical test and measurement solutions that enable the design, validation, and production of next-generation silicon photonics components, co-packaged optics, and optical networks, . Ensure superior performance and reliability, from lab to production and installation.
Photonic Sensing & Analysis
Yokogawa offers a variety of optical measuring instruments with world class performance to support advances in photonic sensing, analysis and environmental sensing.
