Yokogawa OSAs Set the Standard for Optical Precision at ECOC 2025
The need to transmit increasing amounts of data across high-speed optical networks is driving demand for components that leverage multiplexing technologies to increase bandwidth. Evaluating the characteristics and quality of these devices and components requires high-precision test instruments that are fast, accurate and easy to use.
Yokogawa Test&Measurement is helping to meet the evolving test needs of the industry with a comprehensive range of high-accuracy optical spectrum analyzers (OSAs) that will be on show at stand C2320 at ECOC 2025. Designed for exceptional performance, these instruments offer developers the tools they need to advance the latest optical designs and contribute to making digital communication more efficient and capable than ever before.
At ECOC 2025, visitors can explore:
- AQ7420 High-Resolution Reflectometer – Detects a reflection's position and measures its intensity
- AQ7290 High-End Optical Time Domain Reflectometer – a compact, versatile solution for portable optical measurements, ideal for field use and quick testing.
- AQ6380 Highest Performance Optical Spectrum Analyzer – offering unrivalled wavelength resolution down to 5 picometres, ideal for characterising closely spaced telecommunication channels.
- AQ2300 – a modular test system for optical device characterization and production testing.
The AQ6380 in particular is designed for ease and efficiency of use, ensuring the measurement scheme can be set up rapidly and data acquired easily. With wavelength coverage of 1200-1650 nm on the standard model and wavelength resolution from 5 picometres to 2 nm, the AQ6380 supports a wide range of applications from narrowband peak/notch measurements to wideband spectral measurements.
Together with these highlights, the comprehensive portfolio of Yokogawa OSAs covers wavelengths from ultraviolet light at 350 nm up to far infrared at 5.5 µm. Whatever the application and measurement requirement, Yokogawa offers a grating-based OSA that provides a configurable combination of high accuracy, high resolution, high sensitivity and wide dynamic range.
Visitors to ECOC 2025 can see the latest OSAs from Yokogawa Test&Measurement and other leading-edge solutions for accurate optical measurements in action at stand C2320.
AQ7420 High-Resolution Reflectometer
Accurately detects the quantity and location of reflections within connectors and modules and reveals microcracks that standard loss measurements can miss.
- Measurement distance: 100 mm (approx. 4 inches)
- Spatial resolution: 40 μm
- Spurious noise: −100 dB avoids false (ghost) effects
- Simultaneous measurement of multiple reflection and insertion loss
AQ6380 Highest Performance 1200 - 1650 nm
- 0.005 nm (5 pm / 0.624 GHz) resolution
- ±5 pm accuracy
- 67 dB dynamic range
- -85 dBm level sensitivity
- O, C, and L-bands
AQ2300 Series Test Platform
This lineup includes 3-slot and 9-slot frames equipped with trigger synchronization and remote-control functions.
AQ7290 High-End OTDR
- 6 models in AQ7290 series
- Up to 47 dB dynamic range
- Wavelengths:1310 / 1550 / 1625 / 1650 nm
AQ6361 Telecom Production 1200-1700 nm
- 0.03 nm resolution
- ±20 pm accuracy
- 55 dB dynamic range
- -80 dBm level sensitivity
- Highest sweep speed for manufacturing
AQ6150 Series Optical Wavelength Meter
The AQ6150 and AQ6151 models simultaneously measures the wavelength and power levels of both CW and Modulated optical signals from Dense Wavelength Division Multiplexing (DWDM) components, transceivers, and transmission systems for metro, long haul, and access network applications with high speed data rates of 10G, 40G, 100G and beyond.
