Yokogawa Test & Measurement launches the AQ7420 high-resolution reflectometer, using OLCR technology for optical module analysis and microcrack visualization. With 40 µm spatial resolution, -100 dB sensitivity, and optional insertion loss measurement, it’s a powerful, cost-effective solution for optical applications.
Information such as product prices, product specifications, details of services, inquiry information, and URLs contained in news releases is current as of the date of the release but is subject to change without notice.