Optical Test Equipment
- Optical Spectrum Analyzer
- Optical Time Domain Reflectometer
- Optical Wavelength Meter
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Modular Manufacturing Test System
- AQ2212 Frame Controller (9 Slots)
- AQ2211 Frame Controller (3 Slots)
- AQ2200-112 LS Module (DFB, 1/2 channels)
- AQ2200-131/132 Grid TLS Module (C/L band, 1-channel / 2-channel)
- AQ2200-215 Sensor module (high Power up to +30dBm, 970 to 1660 nm)
- AQ2200-221 Sensor module (Dual channel, long wavelength)
- AQ2200-232 Optical Sensor Head (Large diameter detector, 800 to 1700 nm), AQ2200-242 Optical Sensor Head (Large diameter detector, 400 to 1100 nm), AQ2200-202 Interface Module (2-channels)
- AQ2200-312 Optical Attenuator module
- AQ2200-332 Optical Attenuator module
- AQ2200-342 Dual Attenuator Module (with built-in OPM)
- AQ2200-411 Optical Switch Module (1 x 4/1 x 8)
- AQ2200-412 Optical Switch Module (1 x 16)
- AQ2200-421 Optical Switch Module (1 x 2/2 x 2)
- AQ2200-642 Transceiver I/F Module
- AQ2200-651 SG Module
- Portable Power Meters and Light Sources
- Portable Ethernet Testers
AQ2200-421 Optical Switch Module (1 x 2/2 x 2)
- Compact: Optical switches of 1 x 2 or 2 x 2 port configuration in a one-slot size module
- Compatible with SMF(10/125µm) or MMF(50/125µm, 62.5/125µm)
- Low insertion loss: 1.0 dB (typ.)
- High switching reproducibility: within ±0.01 dB
- Can be combined with various AQ2200 series modules or other Yokogawa's optical communication measuring instruments to build versatile measuring systems
High-performance Optical Switch
The AQ2200-421 OSW module features two optical switches with low insertion loss and superior switching reproducibility, in a one-slot size module, and allows selection of 1 x 2 or 2 x 2 port configuration according to the application.Moreover, the optical fiber type can also be selected between SMF(10/125 µm) and MMF(50/125 µm, 62.5/125 µm), allowing a wide range of measuring systems to be built corresponding to the systems or devices used in optical public networks or optical LANs.
Examples of Measurement Application
- For measuring multiple objects, with switching of the object to be measured
- For measuring device characteristics, etc. by switching multiple measuring instruments
- For building a measurement system in combination with a bit error tester, etc.
Overview:
This system does not require manual reconfiguration of optical paths and adjustments of EDFA input power, and that improves measurement throughput and avoids a human error.
Industries:
