AQ2200-421 Optical Switch Module (1 x 2/2 x 2)

  • Compact: Optical switches of 1 x 2 or 2 x 2 port configuration in a one-slot size module
  • Compatible with SMF(10/125µm) or MMF(50/125µm, 62.5/125µm)
  • Low insertion loss: 1.0 dB (typ.)
  • High switching reproducibility: within ±0.01 dB
  • Can be combined with various AQ2200 series modules or other Yokogawa's optical communication measuring instruments to build versatile measuring systems

What are Optical Switches Used For?

Fiber optical switches can make optical fibers more efficient.

How Do Fiber Optic Switches Work?

GE-PON Test System: To evaluate GE-PON systems used for FTTH networks, optical characteristics and IP traffic tests are performed. Since a GE-PON consists of OLTs and multiple ONUs, efficient measurement of multiple ports is required. Utilizing the multiple port AQ2200-4xx optical switch makes it possible to build an efficient automated measurement system by distributing the signal in a custom test network. Since the AQ2200-332 Optical Attenuator is equipped with a monitor power meter, the ONU optical receiving level can be adjusted without changing the fiber connection.

Multicore fiber loss measurement: MPO connector adapter, MT connector adapter and ribbon fiber adapter enable the measurement of the multi-fiber output directly. With the optical switch module, a multi-fiber loss measurement system can be easily configured.

High-Speed Optical Switch

The AQ2200-421 OSW module features two optical switches with low insertion loss and superior switching reproducibility, in a one-slot size module, and allows selection of 1 x 2 or 2 x 2 port configuration according to the application. Moreover, the optical fiber type can also be selected between SMF(10/125 µm) and MMF(50/125 µm, 62.5/125 µm), allowing a wide range of measuring systems to be built corresponding to the systems or devices used in optical public networks or optical LANs.

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Examples of Measurement Application

  • For measuring multiple objects, with switching of the object to be measured
  • For measuring device characteristics, etc. by switching multiple measuring instruments
  • For building a measurement system in combination with a bit error tester, etc.
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Overview:

This system does not require manual reconfiguration of optical paths and adjustments of EDFA input power, and that improves measurement throughput and avoids a human error.

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