The DLM2000 Series mixed signal oscilloscopes are capable of performing enhanced parameter measurements and calculations. This feature allows you to perform automated measurements of waveform parameters of two different areas. It will also allow you to perform automated calculations using the measured waveform parameters such as RMS, max, min, frequency, rise, fall, etc. To configure the DLM2000 for enhanced measurements and calculations, follow the procedures listed below:
Please see the attached PowerPoint file for more examples of enhanced calculation expressions.
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