The AQ2300 Series Test Platform enables high speed, high-density production testing and validation. The modular frame supports a variety of modules and provides tailored solutions for a wide range of small- to medium-scale semiconductor device evaluation and manufacturing systems.
The frames are available in 3-slot or 9-slot types and can be flexibly adapted to small and medium-sized measurement systems.
Receives the start-of-operation signal from external equipment and sends the end-of-operation signal to external equipment.
Save polling operations to monitor the timing of voltage or current generation start and end.
The AQ2300 series SMU have trigger ports not only on the frame side, but also on each channel of the SMU. In addition, in-frame synchronization functionality is also provided, allowing flexible selection of the connection method.
Synchronize Frame with External Equipment
Synchronize Channel with External Equipment
Synchronize SMU Channels
Reduce the time between measurements for significantly improved operational efficiency.
Store measurement data up to 100 k points per channel to reduce the number of measurement segments or files.
Accommodate different function combinations for each channel in each slot:
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