Measurement of I/O Characteristics of Semiconductor Devices
The GS820 is used to apply voltage Vi to the gate input of a logic IC from channel 1 and measure gate output voltage Vo on channel 2. The source and measure channels allow the I/O characteristics of the gate to be measured.
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GS820 Multi Channel Source Measure Unit
- Yokogawa source measure unit GS820
- Precision SMU quick response for automated testing
- High-speed communication improves productivity
- Customizable to enable any test
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