News & Events

Yokogawa Test & Measurement Corporation announces the release today of the AQ6377E optical spectrum analyzer for mid-wave infrared (MWIR) measurements. While inheriting the world-class optical performance of the preceding AQ6377 model, the AQ6377E offers a number of new features and functions that enhance speed, accuracy, and capability, enabling it to meet a broader spread of laser application demands, including environmental measurement.

Yokogawa Test & Measurement launches the AQ7420 high-resolution reflectometer, using OLCR technology for optical module analysis and microcrack visualization. With 40 µm spatial resolution, -100 dB sensitivity, and optional insertion loss measurement, it’s a powerful, cost-effective solution for optical applications.

Yokogawa Test&Measurement introduces the AQ2300 series SMU to Europe, offering high-speed, high-precision voltage/current generation and pulse measurement for semiconductor and communication devices. Its 2-channel modular design boosts productivity, saves space, and streamlines complex testing with superior expandability and performance.

Learn how VDE’s innovative approach, combined with our WT3000E power meter technology, is shaping the future of EV infrastructure and energy metering at public charging points. This powerful collaboration ensures consumer trust and confidence in electric vehicle charging.

The judges noted that the AQ6370E provides a solution to the growing need for high-precision instruments that can measure and analyze the optical spectrum of components and light sources in large-capacity and high-speed optical communication networks. This advanced optical spectrum analyzer was purpose-designed to support the development of these next-generation optical devices and components.