Source and measure, all in one unit
Before semiconductor devices and other electronic components can undergo commercial deployment, they must be characterized under a variety of environmental and functional testing to ensure conformity to specifications. Traditional benchtop testing involving a pair of digital multimeters and power supplies is often cost-prohibitive and time-consuming. A standalone, highly accurate, and highly functional device would be best suited to handle these applications. The source measure unit (SMU) provides:
Integration
- SMU's combine the functionality of several devices including digital multimeters, power supplies, current sources, ohmmeters, and function generators into a compact, standalone device
- Can be used as a storage device for data recording and transferring or as part of a larger test system
Accuracy
- Source and measure hundreds of volts to all the way down to the microamp range, without losing resolution or speed
Functionality
- Seven modes of operation for any situation including VS/IM, VS/VM, IS/VM, IS/IM, VS, IS, and VS/IM or IS/VM*
- Special software for performing I/V curve tracing
- A host of specialized functions for semiconductor testing including built-in and custom sweeps, ramps, and pwm.
*
1. VS = Sourced Voltage
2. IM= Measured Current
3. IS= Sourced Current
4. VM = Measured Voltage
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The GS610 is made up of a programmable current and voltage source, a voltmeter, and an ammeter. Each function can be combined into numerous operation modes.
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The GS820 is a highly accurate and highly functional 2-channel programmable DC voltage/current source that incorporates voltage/current generation and measurement function.
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The GS200 is a low voltage/current DC source with high accuracy, high stability, and high resolution.
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Yokogawa's instruments go beyond conventional options. They are highly accurate, highly functional with programmable voltage/current source that incorporates voltage/current generation for a broader application.
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GS200 |
GS610 |
GS820 |
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Function |
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Generation |
Voltage or Current |
Voltage or Current |
Isolated 2 Channel Voltage/ Voltage Current/Current Voltage/Current |
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Generation Mode |
DC or Pulse |
DC or Pulse |
DC or Pulse |
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Voltage Generation |
10mV to 30V Resolution to 100 nV |
200 mV, 1 µV Resolution to 110 V |
200 mV, 1 µV Resolution to 18 V |
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Current Generation |
1mA to 200 mA Resolution at 10nA |
20 µA, 100 pA Resolution to 3.2 A |
200 nA, 1 pA Resolution to 3.2 A |
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Sweep Modes |
Linear, Log, Program |
Linear, Log, Program |
Linear, Log, Program |
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Measurements |
Voltage, Current, Resistance |
Voltage, Current, Resistance |
Voltage, Current, Resistance |
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Data Storage |
Up to 10K Data Points |
Up to 65.5K Data Points |
Up to 100K Data Points |
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Pulse Width |
10 µsec or greater |
100 µsec to 3600 sec, 1 µsec resolution |
50 µsec to 3600 sec, 1 µsec resolution |
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Period Time |
0.1 sec to 3600 sec |
1 mS to 3600 sec, 1 µsec resolution |
100 µsec to 3600 sec, 1 µsec resolution |
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Output Noise (Typical) |
100 µVp-p (10 V range, DC to 10 kHz) 3 µAp-p (100 mA range, DC to 10 kHz) |
8 mV P-P DC to 20 MHz |
20 mV P-P DC to 20 MHz |
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Interface |
GPIB and USB Standard |
GPIB, USB & RS232 Standard, Ethernet Optional |
GPIB, USB, RS232 and Ethernet all standard |
Source measure units are versatile devices that can precisely source, as well as monitor voltage and current. Because of this, there are numerous applications where these devices find use cases.
Source Measure Units are used for a variety of purposes including acting as a stable power supply or providing a stimulus to a circuit to measure its response. Two channel source measure units extend this capability by being able to source or sink current or voltage on multiple channels, extending their capability to be able to perform efficiency and load testing on two termnal regulators or switched mode power supplies.
Source measure units combine the best features of power supplies and digital multimeters and have numerous applications ranging from battery simulators, semiconductor characterization, and efficiency testing on power electronics.
After a disastrous 2009, the large publicly held test companies enjoyed booming business in 2010.
