Yokogawa at ECOC Exhibition 2025 – Join Us in Copenhagen!
We are excited to announce that Yokogawa will be exhibiting at ECOC 2025, Europe’s leading event for the fibre optic communication industry. Taking place at the Bella Center in Copenhagen, Denmark, from 29 September to 1 October, the exhibition will bring together over 6,500 industry professionals from around the world.
Visit us at Stand C2320 to explore our latest innovations in optical test and measurement solutions. Our experts will be on-site to showcase cutting-edge technologies designed to meet the demands of high-speed, high-performance optical networks.
Experience Our Latest Solutions
Discover how our advanced optical instruments and test systems support faster, more reliable fibre optic networks.
Expert Insights
Engage directly with our technical team to learn how Yokogawa’s solutions can optimize your operations and prepare your infrastructure for the future.
Explore FTTx Innovations
Visit the FTTx Focus area to see our Series Optical Time Domain Reflectometer
Network & Learn
Connect with industry peers, share knowledge, and stay informed on the latest trends shaping the future of optical communication.
We look forward to welcoming you at Yokogawa Stand C2320 at ECOC 2025. Don’t miss the opportunity to discover how our solutions can drive your optical communication projects forward.
Contact us to learn more about our attendance and offerings at ECOC 2025.
This lineup includes 3-slot and 9-slot frames equipped with trigger synchronization and remote-control functions.
The AQ6150 and AQ6151 models simultaneously measures the wavelength and power levels of both CW and Modulated optical signals from Dense Wavelength Division Multiplexing (DWDM) components, transceivers, and transmission systems for metro, long haul, and access network applications with high speed data rates of 10G, 40G, 100G and beyond.
The AQ6150B measures the wavelength and power levels of both CW and Modulated optical signals from transceivers and WDM transmission systems.
Accurately detects the quantity and location of reflections within connectors and modules and reveals microcracks that standard loss measurements can miss.
The AQ2300 series SMU offers precise, high-speed voltage/current measurement for semiconductor and optical device testing.