Yokogawa's new DLM6000 series digital and mixed signal oscilloscopes boast fresh physical and on-screen interfaces, based on extensive market research and user feedback. It incorporates dedicated, backlit buttons for the most commonly accessed settings, and unique Yokogawa controls, like the 5-way selector button and spring loaded ‘jog shuttle' control.
The DLM6000 series oscilloscopes offer an extensive range of capabilities for waveform characterization, powerful tools for detecting glitches and anomalies, advanced signal enhancement and noise reduction technologies, and a range of options for serial bus analysis and power measurement. Select from models with four channels plus 16 or 32 bit logic inputs, and 500MHz, 1.0GHz, or 1.5GHz bandwidths.
High Acquisition Rate Unchanged Even When Displaying Logic Signals
Waveform update rate determines your probability of catching an intermittent glitch. On other mixed signal oscilloscopes, enabling the logic inputs severly impacts waveform update rate. The DLM6000 maintains waveform update rates so you can detect abnormalities and transients in your analog or logic channels. |
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History Memory Function and High Speed Acquisition
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On most oscilloscopes, to observe and analyze abnormalities such as unpredictable noise in detail, you have to devise clever trigger settings and re-measure the event.
But with the DL6000/DLM6000 there is no need to re-measure the phenomena because once the event occurs, you can use the History Memory function to recall past waveforms that were originally displayed on screen.
SD card bus commands are sent intermittently, and the non-signal portions of these waveforms do not need to be analyzed.
To be able to capture the commands that you want to observe from such signals, you can set a serial bus trigger and use the History memory to acquire up to 2000 of the waveforms that match the trigger conditions into History memory while ignoring the non-signal waveforms.
Rather than acquiring a single waveform to the entire acquisition memory, you can acquire multiple waveforms of only the needed command, and analyze them.
Quickly extract locations and abnormalities you wish to analyze from the acquired waveform data, and zoom in anywhere on waveform details. The DL6000/DLM6000 series has enhanced Search and Zoom functions for searching for desired portions of waveform data and observing those waveforms in detail. |
Search function for extracting abnormal phenomena
The search function can search both analog and logic signals in History Memory (History Search).
Main Search Functions:
Display two zoom areas simultaneously
Because the DL6000/DLM6000 series lets you set zoom factors independently, you can display two zoomed
waveform areas with different time axis scales at the same time.
Zoom and scroll with the zoom knob and jog shuttle
Intuitively adjust the zoom factor with the zoom knob, and the scroll with the jog shuttle. You can also scroll the zoom window automatically with the Auto Scroll function.
Automated measurement of waveform parameters - Automatically display waveform values
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Measure a variety of parameters automatically
Simply select the check boxes of parameters you wish to measure automatically in the setting screen's parameter list.
Simultaneously measure up to 16 parameters during acquisition. Additional measured values can be obtained in the analysis screen, or via PC communication.
You can measure waveform parameters of every cycle of a periodic waveform, and display results in lists and trend graphs. This is useful when evaluating period-by-period waveform fluctuations or loss in switching circuits. |
Input Filters
The DLM6000/DL6000 can restrict filter out unwanted high frequency noise and expose only the frequency bandwidth of the signals you are working with. Every analog channel offers independent, real-time bandwidth filters.
High Resolution Mode
Digital oscilloscopes have offer excellent time resolution. However, nearly all digital oscilloscopes provide only 8-bits of vertical (voltage) resolution. With Yokogawa's High Resolution mode (real-time FIR filter), the oscilloscope will oversample and reconstruct a higher resolution signal with resolutions of up to 12 bits. Unlike averaging, High Resolution mode does not require a repetitive signal and works on single shot acquisitions.
Switching Waveform Measurement When measuring SMPS waveforms, highly precise evaluation is impossible due to the insufficient dynamic range offered by 8-bit oscilloscopes. In such cases, you can use High Resolution mode to raise the precision of the waveform as well as of any computed results. |
To easily isolate specific waveforms, the DL6000/DLM6000 offers a variety of application-oriented triggers, from simple edge triggers to pulse width, multi-criteria combination and time difference triggers. |
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When your test involves waiting for intermittent phenomena, you can use the Action On trigger function to automatically save waveform data to file when trigger conditions are met. You can also send e-mail notifications on every trigger. Even for phenomena that occur only once per day or less, you can be sure that a record of the data, including the date and time, will be kept.
Observing up to 32-bit logic signals together with analog signals
Observing many signals simultaneously and checking their correlations and timing is an effective means of verifying increasingly complex embedded systems.
With the DLM6000 series, you can measure up to 32-bit logic signals and 4 channels of analog waveforms simultaneously, and investigate hidden data in waveforms using bus analysis and computation functions.
Grouping logic signals to make them easy to read and understand
As many as 5 groups of logic signals can be defined. You can enter display settings for each group, and specify which bit in each group is the LSB or MSB
regardless of the bit arrangement of the logic probe.
This means that even if pin assignments or signal arrangements change, you only need to change settings rather than to repeat the probing of the circuit.
Bus and State displays make logic signals easy to read and analyze
The DL6000/DLM6000 is not limited to displaying logic signals as waveforms. It can also show logic signals assigned to groups in a Bus display, or specified
clock signals in a State display.
Therefore, parallel output values of an address bus or A/D converter can be read directly. Functions like these make analysis of logic signals easy, so that operating checks of the device under test can be performed more quickly and accurately.
Virtual D/A Computation function displays to 32-bit logic signals as analog waveforms
The DL6000/DLM6000 includes a Virtual D/A Computation function, in which address bus signals or logic signals from data converter I/O can be converted to analog waveforms and displayed. You can display logic signals output from an A/D converter, and by comparing them with the original analog waveforms prior to conversion, you can investigate the general dynamic characteristics of the A/D conversion. Displaying the address bus signal as a waveform is also useful for identifying instances of abnormal memory access. D/A converted waveforms can undergo FFT analysis or have additional digital filtering computations applied to them. |
Making logic signal measurement probing easier and minimizing effects on the target
There are two different types of logic probe that can be used with the DLM6000, depending on the application.
You can add on I2C, SPI, CAN, LIN, and other serial bus-specific trigger and analysis functions to your DL6000/DLM6000 series instrument. With these functions, you can trigger on specific serial bus parameters, and display the waveforms along with protocol analysis indicating the decoded serial bus information.
Moreover, the DL6000/DLM6000 series also comes with a "Serial Bus Auto-Setup" function to eliminate the tedious task of entering settings when starting the analysis.
Auto Setup Function for Serial Bus Analysis
Display signal waveforms, protocol information, and decode information in real time The DL6000/DLM6000's serial bus analysis function simultaneously displays these three pieces of information on screen in real time. You can link the protocol information with the waveform information, select data in the protocol list, and automatically display the corresponding part of the analog waveform. Check the protocol list to see whether transferred information is correct. If not, you can determine whether there were any electrical problems at the waveform level. In operational analysis of systems that include serial busses, this can be very useful for sorting out hardware from software problems. |
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Analyzing two busses at once Both analog and logic inputs can be used for serial bus analysis. Also, two different serial busses can be analyzed at the same time. For example, you can analyze a CAN and LIN bus simultaneously, or use an MSO to analyze two SPI busses at once. |
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Example: Behavioral analysis of an I2C control motor You can trigger on specific data sent to a motor controller on an I2C bus and capture the waveform. Then, you can observe and analyze the content and timing of the data, plus the behavior of the activated motor. Together with that, you can use an MSO to observe control circuit logic signals, enabling you to evaluate the overall system. |
Digital filters, integrals, edge, rotary count, logic signal DA conversion computation, and FFT computation functions come standard. As these computations are hardware-based, results appear on screen quickly. Even computations that traditionally needed to be sent to a separate PC for processing can now be executed at high speed on the oscilloscope, thus greatly reducing the time and effort involved in computing and analyzing waveform data.
Digital Filter Computations Digital filters, integrals, edge, rotary count, logic signal DA conversion computation, and FFT computation functions come standard. As these computations are hardware-based, results appear on screen quickly. Even computations that traditionally needed to be sent to a separate PC for processing can now be executed at high speed on the oscilloscope, thus greatly reducing the time and effort involved in computing and analyzing waveform data. |
FFT Computation You can perform FFT computation for analog signal waveforms or DA computation waveforms. This includes not only signal spectra, but also coherent and transfer functions. |
User defined MATH (option) By combining basic math, trigonometric functions, differentials, digital filters,waveform parameters, and other values, you can define and execute equations and display the results along with the observed waveform |
Power Supply Analysis Function (optional)
By using combinations of differential and current probes, you can evaluate switching loss or analyze safe operating area (SOA) in power supply waveforms. Through statistical computation you can also measure multiple switching waveforms and display loss on a per-week basis in lists and trends, or display statistics on aggregate loss of up to 2000 switching waveforms stored in History Memory. If precise calculations are required, a correction function and High Resolution mode are available.
Cycle-by-cycle switching loss statistics and trend display It can be extremely useful to check for fluctuations in switching frequency or voltage modulated by the commercial power input voltage on screen, at the same time as the waveform of that input voltage. Fluctuations in cycle-by-cycle loss, peak current, and other phenomena can be checked in lists and trend graphs thereby allowing you to identify excessive changes from power-ON to stable operation. |
Waveform parameter measurement function for power supply analysis |
Harmonic Analysis of Power Supply Current Based on EN61000-3-2 (IEC61000-3-2)
Bar graphs and lists of harmonics can be displayed together with the appropriate limits for the device under test as defined by the IEC standard (supports device classes A-D). Any measured value which exceeds the limit is highlighted.
While accurate rise time measurements have become easier to make, it remains, nonetheless, quite easy to overlook error contributions due to not only the oscilloscope but also the probe. And, while the error contributed by a scope's finite step-response (rise time) is often accounted for, that contributed by the probe is often overlooked.
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