The AQ6373B is one of the latest additions to the AQ6370 Series of Optical Spectrum Analyzers. With the ability to provide high speed, accurate analysis of the short wavelength range between 350nm and 1200nm, this OSA is well suited for a broad range of applications. The AQ6373B can accelerate the development and manufacturing of short wavelength lasers, passive devices and LEDs as well as equipment that uses these devices for the biomedical, material processing, consumer product and telecommunications markets. With built in color analysis capabilities and remote command compatibility with the AQ6315, the AQ6373B provides an upgrade of capabilities, speed and performance for current AQ6315 users.
405 nm FP-LD measurement (resolution setting: 0.01 nm)
In 400-470nm range, achieves even higher resolution.
Applications
High Resolution & High Dynamic Range
The advanced monochromator achieves high wavelength resolution and high close-in dynamic range. With the sharper spectral characteristics of the monochromator, spectral signals in close proximity can be separated clearly and measured accurately.
High Sensitivity
Weak optical signals can be measured accurately and quickly.
7 sensitivity settings
Can be selected according to test applications and measurement speed requirements.
High dynamic mode
Obtains a better dynamic range by reducing the influence of stray-light, which is caused when the input is a strong optical signal.
Pulsed Light Measurement
Peak-Hold and External trigger mode
Measure a pulse peak spectrum of a pulsed light signal. Often used in the transmission loop testing of telecommunication systems, and also in the low power measurement at the early stage of laser chip development to catch the peak power of a pulsed signal.
Free Space Input
■Multimode and single mode fiber on the same OSA
■Small insertion loss variation at the input connector increases measurement repeatability.
■No damage connecting fibers because there is no physical contact.
■Supports SM, GI (50/125 μm, 62.5/125 μm) and large core fiber up to 800 μm.
Fast Sweep
With an advanced monochromator, faster electrical circuits, and noise reduction techniques, the AQ6373B achieves fast measurement speed even when measuring a steep spectrum from DFB-LD signals, or when measuring a low power signal from a broadband light source.
Wide Span Sweep yet High Resolution
The 50,001 data sampling points expands measurement range in a single sweep while keeping a high wavelength resolution. This makes your measurements easier and more efficient than conventional systems that use a low number of sampling points and require multiple partial measurements to cover the complete wavelength range.
Ambient condition change, vibration and shock to an optical precision product, like an optical spectrum analyzer, will effect the optical components and eventually degrade optical performance.
Using standard functions, the AQ6373B can maintain its high optical performance within a couple of minutes so that you can quickly start a measurement.
Optical alignment function
Automatically aligns the optical path in the monochromator using the built-in source to maintain high performance.
Wavelength calibration function
Automatically calibrates the spectrum analyzer with an external light source, to ensure the wavelength accuracy.
Built-in optical alignment source
Note. GI 50/125µm fiber is required.
An external light source is required for the wavelength calibration.
Note. There are cases that the optical alignment and wavelength calibration function cannot correct optical performance.
Periodical calibration is also required.
Data Logging function
Records analysis results such as distributed feedback laser diode (DFB-LD) analysis and multi-peak measurements at up to 10,000 points per channel with time stamps. This function is useful for the long-term stability testing and temperature cycle testing of systems and devices.
Advanced Marker function
Adds markers to obtain the power density and the integrated power of a designated spectrum.
Trace zooming
■Change display conditions, such as center wavelength and span, by clicking and dragging the mouse.
■Enlarge your area of interest instantly and move it at will.
■No need for another measurement to modify the display conditions.
Mouse & Keyboard operation
■Front panel operation proven intuitive and easy to use by our many of users.
■Even easier with a mouse.
■The keyboard helps enter labels and file names.
■USB storage
-USB 1.1 compatible interfaces support large size removable memory devices such as Flash ROM and hard disk drives (HDD).
- Easy way to carry a large number of data files.
■512MB Internal storage
- Save over 20,000 data files
File types and formats:
- Trace: Binary and ASCII (CSV)
- Graphic: Bitmap (BMP) and TIFF
- Analysis results: Binary and ASCII (CSV)
- Template: ASCII (CSV)
- System setup: Binary
- Macro program: Binary
Thumbnail File Preview
Easy to find a particular file out of thousands of files in internal and external storage.
Spectrum analysis functions
12 data analysis functions for popular applications
■Built-in analysis functions:
- Spectral width analysis
- OSNR analysis
- DFB-LD analysis
- FP-LD analysis
- LED analysis
- SMSR analysis
- Optical power analysis
- Various filter analysis
- Color analysis
7 individual traces
■Calculation between traces (subtraction between traces
■Max/Min hold
■Simultaneous multi-trace display
Macro programming
Build a simple auto-measurement system
■No external PC is required.
■Easy to create test program by recording the user’s actual key strokes and parameter selections.
■Can control external equipment through the remote interfaces.
Fast remote interfaces
■GP-IB, RS-232, and Ethernet (10/100Base-T) interfaces
Easy to control with an external PC and to build an automated test system.
■Improve the testing throughput of test systems
by the fast measurement, command processing, and data transfer speed.
SCPI compatible
The standard remote commands are compatible with SCPI, which is an ASCII text based standard code and format that conforms to IEEE-488.2.
AQ6317 Emulation mode
Supports the private remote commands of Yokogawa's best selling AQ6317 series and AQ6315 for users to easily upgrade from their current automated test environment.
Note. some commands may not be compatible due to changes in specifications and functions.
LabVIEW® driver available
■Visible LED Test
The optical spectrum of visible LEDs used in lighting, indication, measurement and applications can be measured and analyzed.
By supporting the large core fiber input, the AQ6373B can efficiently get the LED light and measure its spectrum. The built-in color analysis function automatically evaluates a dominant wavelength and chromatic coordinates.
■Analysis of FP-LD (VCSEL) sources
Today FP-LD sources emitting in the visible (VIS) wavelength range are mounted into many different devices/systems used in different areas of application, such as:
405 nm FP-LD measurement (resolution setting: 0.01 nm)
VCSEL seen through a Scanning Electron Microscope
By connecting a GI 50 or GI 62.5 optical fiber with a relatively large NA to the NA Conversion Fiber, the NA Conversion Fiber reduces the loss that occurs at the input and improves the measurement dynamic range during passive device measurements and the stability of optical level measurements during active device measurements.
Lack of reliable high-speed internet access in rural regions, due to complicated logistics and the considerable costs involved to extend land-based networks to these areas, has inspired a wave of next-generation applications that will provide greater accessibility and reliability. Making use of “space laser” networks, these revolutionary solutions can relay digital traffic via low Earth orbit (LEO) satellite systems to provide low-latency, high-speed broadband services to communities typically beyond the reach of standard wireless and fiber networks.
To accurately measure pulsed light using an optical spectrum analyzer (OSA), it is necessary to understand the characteristics of the OSA and select the appropriate measurement method and settings.
Laval University is a research institution world renowned for optics and photonics technology research and training, and are the founders of The Center for Optics, Photonics, and Lasers (COPL).
The university's researchers needed a faster and more efficient and practical solution to measure the spectral performance of lasers and optics beyond traditional telecom wavelengths. To achieve this, they contacted Yokogawa Test&Measurement and collaborated to develop a breakthrough grating-based optical spectrum analyzer that could cover MWIR wavelengths up to 5.5 um. Click to learn how productivity in the research lab dramatically increased for precise characterization of laser sources, and active/passive optical components in the fields of communications, medical diagnosis, advanced optical sensing, and environmental and atmospheric sensing.
The extreme test requirements of our research called for an OSA with extended MIR spectrum bandwidth capabilities up to 5μm, but we couldn’t find one on the market capable of measuring optical inputs at these wavelengths. Yokogawa Test&Measurement rose to the challenge and developed a new OSA model for us that would. Not only do we now have an instrument that is practically custom-made for our needs, it provides repeatable, accurate, and trusted measurement outputs and is easy to learn and use. Their equipment and ability to create a new optical measurement solution has definitely increased the overall efficiency and productivity of our research team.
— Martin Bernier, PhD, P.Eng., Full Professor, Centre de Optique, Photonique, et Laser, Université Laval
Mastering the fundamentals of optical wavelength measurements and having a solid understanding of measurement principles for optical sources and devices is key to measuring with confidence. This webinar provides a thorough review of these foundational elements and concepts as well as:
There are countless technologies available for optical communications devices and systems validation. With so many specifics to take into consideration, it's not always easy for an engineer to determine the best networking and fiber optic measurement solution to address their measurement needs.
Key discussions in this on-demand webinar include: