AQ6377 Five Micron Optical Spectrum Analyzer 1900 - 5500 nm
The AQ6377 is the latest version of our optical spectrum analyzer series, offering extended wavelength coverage into the MWIR region from 1900 - 5500 nm. Its long wavelength range makes the AQ6377 ideal for environmental sensing and medical applications.
Key features of the AQ6377 optical spectrum analyzer include gas purging input ports/output ports, a built-in cut filter for high order diffracted light, and a novel double speed mode which increases the sweep speed up to 2 times compared to the standard sweep mode.
Features:
Wavelength range: 1900 to 5500 nm
Wavelength resolution settings: 0.2 to 5 nm
Wavelength accuracy: ±0.5 nm
Level range: −60 to +13 dBm
Dynamic range: 50 dB
Key Features
- Wavelength range: 1900 to 5500 nm
- 5 wavelength resolution settings: 0.2 to 5 nm
Enables the user to choose the best value according to the device/system under test. - Wide measurable level range: −60 to +13 dBm
Suitable to measure high power as well as low power sources used in different fields of application. Sensitivity: HIGH1-3 are only high dynamic mode. - Wavelength accuracy: ±0.5 nm
Easily maintained due to the built-in Calibration Function and wavelength reference source. - Close-in dynamic range: 50 dB
Measurement example of 4.3 μm DFB laser
(Res: 0.2 nm, Span: 50 nm)
- Horizontal scale also in Wave Number (cm−1)
In addition to the commonly-used scales in wavelength (nm) and frequency (THz).
Purge Feature
Due to the high resolution and sensitivity of the AQ6377, it can actually detect the presence of water molecules in the air. The water vapor is detected in the upper Near-IR wavelength region and could overlap with or mask the spectral characteristics of the actual device under test in that particular region.
By continuously supplying a pure purge gas such as nitrogen to the monochromator through the ports on the back panel, the AQ6377 can reduce the influence of water vapor absorptions and provide more reliable and accurate measurements than ever before.
Built-in Cut Filter for High Order Diffracted Light
Due to the diffractive technology used, the monochromator in some circumstances could generate high order diffracted light, which appears at wavelengths equal to the integral multiple of input wavelengths.
By cutting incoming light below 1500 nm with the built-in filter, the AQ6377 drastically reduces the influence of high order diffracted light on the measurement. Thus, the measured data are always reliable and replicate the real signal under test.
Double Speed Mode
Increases the sweep speed up to 2 times compared to the standard sweep mode, with only a 2 dB penalty to the standard sensitivity value.
Free-Space Optical Input
The AQ6377 uses a free-space optical input structure (i.e. no fiber is mounted inside the instrument), most effective for guaranteeing high coupling efficiency, measurement repeatability, and no maintenance.
This smart solution is:
- WORRY-FREE: no internal fiber can be scratched or get dirty by inaccurate coupling of fibers
- MAINTENANCE-FREE: no internal fiber has to be cleaned
- VERSATILE: the instrument accepts both /PC and /APC connectors
- DUAL PURPOSE: the instrument accepts both Single-Mode and Multi-Mode fibers without being affected by the high insertion loss from MM-SM fibers matching
Key Functions
Data Logging Function
Records analysis results such as distributed feedback laser diode (DFB-LD) analysis data and multi-peak measurements at up to 10,000 points per channel with time stamps.
Advanced Marker Function
Adds markers to obtain the power spectral density and the integrated power of a designated spectrum. This new feature makes it easy to get an OSNR value of the signal, whether modulated or not, directly from its spectrum.
Building Automated Test Systems
Thanks to the built-in Macro Programming Function, all AQ6370 Series models can perform automatic measurements and control external equipment through their remote interfaces.
GP-IB, RS-232 and Ethernet ports enable the instrument to be remotely controlled by a PC using standard SCPI-compatible or proprietary AQ6317-compatible commands. LabVIEW® drivers are also available.
Built-in Calibration Source
Ambient temperature change, vibrations, and shock affect the measurement accuracy of high precision products such as optical spectrum analyzers. Yokogawa OSAs must be able to deliver the precise measurements for which they were designed; therefore, our instruments are equipped with a light source for calibration.
The calibration process is fully automatic and takes only 2 minutes to complete. It includes:
- The Optical Alignment function, which automatically aligns the optical path in the monochromator to assure the level accuracy
- The Wavelength Calibration function, which automatically calibrates the spectrum analyzer with the reference source to ensure the wavelength accuracy
Built-in analysis functions to increase your testing efficiency
Spectrum Width Analysis
You can display the spectrum width and center wavelength using the following 4 types of calculation:
- THRESH method
- ENVELOPE method
- RMS method
- PEAK RMS method
Notch Width Measurement
With this function it is possible to measure pass bandwidth / notch width from the measured waveform of a filter with V-type or U-type wavelength characteristics.
Light Source Analysis
Light source parameters can be analyzed from the measured waveform of each type of light source among DFB-LD, FP-LD and LED.PMD Measurement
It is possible to measure the Polarization Mode Dispersion (PMD) of a DUT (such as an optical fiber) by using the instrument in combination with an Analyzer, Polarization Controller, Polarizer, and an Amplified Spontaneous Emission (ASE) light source, High-output LED light source, or other wideband light source.
WDM (OSNR) Analysis
With this function it is easy to analyze WDM transmission signals. You can also measure OSNR of a DWDM transmission system with 50 GHz spacing. Measurements of WDM signal wavelength, level, wavelength interval, and OSNR can be made collectively on up to 1024 channels, and the analysis results can be displayed in a data table.
Optical Amp Analysis
Gain and Noise figure measurements can be made on signal light waveforms going into optical amplifiers, as well as light leaving the optical amplifiers.
Optical Filter Characteristics Measurement
Optical filter characteristics can be measured from the measured waveforms of the light, from source, going into optical filters, as well as from the measured waveforms of light being output from optical filters. Analysis can be performed not only on optical filters with one mode, but also multimode filters (e.g WDM Filters).
Measurement of Level Fluctuations in Single-Wavelength Light
This function is used to measure changes over time in the level of a specific wavelength level. The sweep width is set to 0 nm, and measurement of the single-wavelength light is taken. The horizontal axis is the time axes. It is useful for purposes such as optical axis alignment when a light source is input to an optical fiber.
Template Analysis
The template function compares preset reference data (template data) with a measured waveform. In addition, if a function for displaying the target spectrum (target line) on the measurement screen is used, the target spectrum can be referenced while adjusting the optical axis of an optical device.
Go/No Go Judgment
The Go/No Go test function compares the active trace waveform against reference data (template data) preset by the user, and performs a test on the measured waveform (Go/No Go test).
This function can be used effectively in situations such as pass/fail tests on production lines.
Analysis between Line Markers / in the Zoom Area
The instruments perform the analysis of the signal contained into boundaries selected by means of line markers or zoomed area.
AQ9447 Connector Adapter
- AQ9447 Connector Adapters
- For optical input port
- AQ6370 Series Optical Spectrum Analyzer Accessories
NA Conversion Adapter
- 735383-A001, A002 numerical aperture conversion adapters
- Half numerical aperture of optical fiber
- AQ6370 series optical spectrum analyzers' free-space optical input structure
OSA Macro Program Function
The OSA Macro Program Function enables automated measurement by creating programs for entry of measurement conditions and other tasks. Users can program a sequence of measurement procedures from entry of measurement conditions (e.g., wavelength sweep width, setting resolution) to analyses, data saving, output, and others and eliminates redundant procedures on the production line. The function acts as a controller of other connected devices through the LAN or RS232C port and allows users to build an automatic measuring system without using an external PC and input measurement conditions or output measured results while programs are running.
To accurately measure pulsed light using an optical spectrum analyzer (OSA), it is necessary to understand the characteristics of the OSA and select the appropriate measurement method and settings.
Laval University is a research institution world renowned for optics and photonics technology research and training, and are the founders of The Center for Optics, Photonics, and Lasers (COPL).
The university's researchers needed a faster and more efficient and practical solution to measure the spectral performance of lasers and optics beyond traditional telecom wavelengths. To achieve this, they contacted Yokogawa Test&Measurement and collaborated to develop a breakthrough grating-based optical spectrum analyzer that could cover MWIR wavelengths up to 5.5 um. Click to learn how productivity in the research lab dramatically increased for precise characterization of laser sources, and active/passive optical components in the fields of communications, medical diagnosis, advanced optical sensing, and environmental and atmospheric sensing.
The extreme test requirements of our research called for an OSA with extended MIR spectrum bandwidth capabilities up to 5μm, but we couldn’t find one on the market capable of measuring optical inputs at these wavelengths. Yokogawa Test&Measurement rose to the challenge and developed a new OSA model for us that would. Not only do we now have an instrument that is practically custom-made for our needs, it provides repeatable, accurate, and trusted measurement outputs and is easy to learn and use. Their equipment and ability to create a new optical measurement solution has definitely increased the overall efficiency and productivity of our research team.
— Martin Bernier, PhD, P.Eng., Full Professor, Centre de Optique, Photonique, et Laser, Université Laval
Brochures
Instruction Manuals
- AQ6377 Optical Spectrum Analyzer User's Manual (11.5 MB)
- AQ6377 Optical Spectrum Analyzer Getting Start Guide (3.9 MB)
- AQ6377 Optical Spectrum Analyzer Remote Control User's Manual (2.8 MB)
Software
- MATLAB Toolkit for AQ6370 series Optical Spectrum Analyzer
- Remote monitor software for AQ6370C, AQ6150
- Sample Program for OSA
- Logging Data Utility
Drawings
- AQ6377 Optical Spectrum Analyzer (892 KB)
Product Overviews
Webinars
- Fiber identification and recommendations for routine care
- Measurement techniques for different optical measurement devices
- Example wavelength-specific applications for visible light to over 3000 nm such as telecommunications, biomedical, and atmospheric gas sensing
- Important considerations for selecting an optical spectrum analyzer
- The what, why, and how of available options like optical spectrum analyzers, optical wavelength meters, optical power meters, variable attenuators, fixed and tunable laser sources, and more
- How to improve the quality and value of results for both active and passive optical devices
- Ways to streamline productivity and reduce costs while also achieving higher data transmission rates, longer-distance transmissions, immunity to EMI, lower signal loss, lower latency, enhanced security, and improved energy efficiency
- Trends driven by applications such as AI, quantum, and inter-satellite laser communications (i.e., space lasers!)
Mastering the fundamentals of optical wavelength measurements and having a solid understanding of measurement principles for optical sources and devices is key to measuring with confidence. This webinar provides a thorough review of these foundational elements and concepts as well as:
There are countless technologies available for optical communications devices and systems validation. With so many specifics to take into consideration, it's not always easy for an engineer to determine the best networking and fiber optic measurement solution to address their measurement needs.
Key discussions in this on-demand webinar include: