AQ7420 High-Resolution Reflectometer
Detects Reflection Positions and Intensities
The AQ7420 precisely identifies both the location and magnitude of reflections within optical connectors and modules, revealing microcracks or misalignments that standard loss measurements often miss. Unlike conventional OCWR methods, it makes previously undetectable defects visable, helping to prevent unpredictable failures.
Compared with OFDR-based reflectometers, the AQ7420 delivers sharper, spurious-free waveforms, making it ideally suited for high-precision inspection. These capabilities are particularly valuable for reliability testing of components subjected to prolonged high-temperature operation, where hidden defects can cause premature failure. When paired with the optional sensor head unit, it can also measure insertion loss simultaneously, providing a versatile solution for both R&D and production environments.
Spurious noise reduction
With some conventional reflectometers, spurious noises may falsely appear in areas where there is no actual reflection. Waveform analysis often requires that users have specialized knowledge of this sort of phenomena. The AQ7420 greatly reduces spurious noises and simplifies analysis.
- Measurement distance: 100 mm (approx. 4 inches)
- Spatial resolution: 40 μm
- Spurious noise: −100 dB avoids false (ghost) effects
Simultaneous measurement of multiple reflection and Insertion loss
Traditionally, reflectometers have been inadequate for inspection of reflection attenuation due to poor measurement accuracy of the vertical axis (back reflection). The AQ7420 enables measurement with an uncertainty of ±3dB, and using the optical sensor head, connector connection loss can be measured simultaneously with an uncertainty of ±0.02 dB.
Multi-fiber Measurement
By combining with the optional multi-switch unit, multi-fiber measurement becomes available.
Channel switching time: 1 sec
Channel switching repeatability: ±0.02 dB
Insertion loss: ≤ 2.6 dB
Microcrack analysis for optical connectors
The AQ7420 simultaneously measures breaks, cracks, losses, and reflections of optical connectors.
Measurement example of microcracks in optical connectors (high sensitivity range)
RL and IL Measurement in One Step
By combining the AQ7420/AQ7421 with the AQ740023 Sensor Head, users can automatically measure both return loss and insertion loss at two wavelengths simultaneously with a single system. With its spurious-free and high-sensitivity performance, the system clearly distinguishes reliable products (absence of reflection peaks) from defective ones (reflection peaks present). The control software also issues inspection reports to streamline quality management.
Dual-Wavelength RL and IL Measurement for Multi-Fiber Devices
When paired with the AQ740027, the AQ7420/AQ7421 enables automatic inspection of multiple fibers and devices such as splitters.
It can measure return loss and insertion loss simultaneously across multiple ports. This eliminates the need for manual reconnections or switching, allowing multiple ports to be tested with a single button press for maximum efficiency.
Component Position and Reflection Analysis in Optical Devices
With high spatial resolution, spurious-free operation, and sharp waveforms, the AQ7420 precisely identifies component positions inside optical devices and measures the reflected light generated at their edges.
宣传手册
- High-Resolution Reflectometer AQ7420 (611.4 KB)
- AQ7420 series High-Resolution Reflectometer (6.2 MB)
操作手册
- Precautions Concerning the Units for AQ7420 (207.1 KB)
- AQ7420 High-Resolution Reflectometer Getting Start Guide (1.5 MB)
- AQ7420 High-Resolution Reflectometer User's Manual (4.4 MB)
图纸
- AQ740023 Sensor Head (213.9 KB)
- AQ7420 High-Resolution Reflectometer (413.5 KB)
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