AQ23811A Source Measure Unit (±6 V / ±600 mA)

Dual-Channel Voltage and Current Sourcing and Measurement for Optical and Semiconductor Devices 

The AQ23811A is a two-channel source measure unit module for the AQ2300 Series Test Platform. It combines voltage and current generation with voltage and current measurement, allowing electrical characteristics to be evaluated using a single compact module. 

The AQ23811A is designed for the evaluation and inspection of optical semiconductor devices such as laser diodes, photodiodes, LEDs, and optical modulators, as well as electronic semiconductor devices such as transistors and FETs. A nine-slot AQ2300 frame can accommodate up to 18 SMU channels.

Key Specifications

  • Source & Measure: ±6 V / ±600 mA
  • Sink & Measure: ±6 V / ±200 mA 
             ±2 V / ±600 mA
  • 2 channels (1 slot width)
  • DC, Pulse (50 µs to 1 s)
  • External trigger I/O
  • Linear sweep, log sweep, program sweep

Static Testing of Laser Diode Module

Generate different voltages or currents from several channels and use the sweep synchronization function to measure the I/V or I/L characteristics of the LD.

Features

  • Synchronization of LD current sweep with PD current measurement and optical power measurement
  • Microcurrent measurement with a minimum resolution of 1 pA (200 nA range)
  • Measurement data format in CSV or binary format
  • Digital I/O interface supports SMU operation start and end response communication

Laser Diode Modules Static Testing | AQ23811A Source Measure Unit | Yokogawa Test&Measurement

Filter Characteristic Tests of WDM Photodiode Modules

Generate different voltages or currents from several wavelength division multiplexing (WDM) channels and use the sweep synchronization function to measure filter characteristics of each individual channel.

Features

  • Synchronization of wavelength sweep and amplifier IC current measurement
  • Microcurrent measurement with a minimum resolution of 1 pA (200 nA range)
  • Measurement data format in CSV or binary format

WDM Photodiode Modules Filter Characteristic Tests | AQ23811A Source Measure Unit | Yokogawa Test&Measurement

Covers Applications from R&D to Production

Frame and SMU Features

The frames are available in 3-slot or 9-slot types and can be flexibly adapted to small and medium-sized measurement systems.

  • Expandable up to 18 channels with 2-channel SMU
  • Digital I/O interface can be selected
  • 3-trigger synchronization systems
  • Simultaneous measurement of voltage and current possible
  • Simplified response adjustment
  • High-speed data transfer
  • Measurement data storage up to 100 k points per channel
  • Channel-to-channel and module-to-module isolation
  • Hot swappable modules
     

Digital I/O (Factory Option)

Receives the start-of-operation signal from external equipment and sends the end-of-operation signal to external equipment.
 

Digital I/O Interface Port Configurations

Digital I/O Interface Port Configurations | AQ23811A Source Measure Unit | Yokogawa Test&Measurement

Save polling operations to monitor the timing of voltage or current generation start and end.
 

Various Trigger Synchronization Functions

The AQ2300 series SMU have trigger ports not only on the frame side, but also on each channel of the SMU. In addition, in-frame synchronization functionality is also provided, allowing flexible selection of the connection method.

Synchronize Frame with External Equipment | AQ23811A Source Measure Unit | Yokogawa Test&Measurement
Synchronize Frame with External Equipment


Synchronize Channel with External Equipment | AQ23811A Source Measure Unit | Yokogawa Test&Measurement
Synchronize Channel with External Equipment


Synchronize SMU Channels | AQ23811A Source Measure Unit | Yokogawa Test&Measurement
Synchronize SMU Channels

More Optimized Response Adjustments

The AQ2300 SMU can be adjusted to reduce rising edge overshoot and ripple. These can be made easily by entering the R, L, and C values for the load.

Optimized Response Adjustments | AQ23811A Source Measure Unit | Yokogawa Test&Measurement

High-Quality Pulse Generation and Measurement

The AQ2300 Series SMU can generate high-quality pulse signals with the response adjustment function and digital feedback technology.

  • Minimum Pulse Width: 50 μs
  • Minimum Cycle: 100 μs

High-Quality Pulse Generation and Measurement | AQ23811A Source Measure Unit | Yokogawa Test&Measurement

Faster Data Transmission Speeds

Reduce the time between measurements for significantly improved operational efficiency.

Faster Data Transmission Speeds | AQ23811A Source Measure Unit | Yokogawa Test&Measurement

Fewer Measurement Segments

Store measurement data up to 100 k points per channel to reduce the number of measurement segments or files.

Fewer Measurement Divisions | AQ23811A Source Measure Unit | Yokogawa Test&Measurement

Specifications

Current Limiter

|Setting|*3 Range Resolution |Min. Setting|*4
10.000 nA to 200.000 nA 200 nA 1 pA 10 nA
0.20001 µA to 2.00000 µA 2 µA 10 pA 10 nA
2.0001 µA to 20.0000 µA 20 µA 100 pA 100 nA
20.001 µA to 200.000 µA 200 µA 1 nA 1 µA
0.20001 mA to 2.00000 mA 2 mA 10 nA 10 µA
2.0001 mA to 20.0000 mA 20 mA 100 nA 100 µA
20.001 mA to 200.000 mA 200 mA 1 µA 1mA
200.01 mA to 600 mA 600 mA 10 µA 1mA

*3: The current range is determined by the greater of the High and Low limiters.
*4: Minimum setting when tracking is OFF.

Voltage Limiter

|Setting| Range Resolution |Min. Setting|
0.0060 V to 6.0000 V 6 V 100 µV 5 mV

Maximum capacity/Inductive Load*5

Capacity Load Inductive Load
100 µF 10 µH

*5: Response adjustments may be required.

Output Noise (Typical)

20 mVp-p For 10 Hz to 20 MHz, 6 V Voltage source range, Output liberation

Response time (Typical)

Voltage
Range
Limit
Setting
Response
Time*6
Load Conditions RC Setting
R C R C
6 V ±200 nA 2.5 ms >1 GΩ 25 pF 100 MΩ 25 pF
±2 µA 0.5 ms
±20 µA 50 µs
±200 µA 10 µs
±2 mA
±20 mA
±200 mA
±600 mA

*6: Time from the start of the output voltage change to within 0.1% of the final value when the output voltage is varied from 0 V to 6 V.

Current
Range
Limit
Setting
Response
Time*7
Load Conditions RL Setting
R L R L
200 nA 6 V 150 µs 1 MΩ 20 nH 1 MΩ 20 nH
2 µA 100 kΩ 100 kΩ
20 µA 20 µs 10 kΩ 10 kΩ
200 µA 1 kΩ 1kΩ
2 mA 100 Ω 100 Ω
20 mA 15 µs 10 Ω 10 Ω
200 mA 1 Ω 200 nH 1 Ω 200 nH
600 mA

*7: The time from the beginning of the change to within 0.1% of the final value when the output current is varied from 0 A to the full scale current of the set range.

DC Voltage Measurement

Range Measurement Range Resolution — Accuracy ±(% of reading + V) Temperature Coefficient
±(% of reading + V)/°C
6 V ±6.3000 V 100 µV — 0.02 + 500 µV 0.002 + 30 µV

DC Current Measurement

Range Measurement Range Resolution Detection resistance Accuracy ±(% of reading+A) Temperature Coefficient
±(% of reading+A)/°C
200 nA ±210.000 nA 1 pA 5 MΩ 0.05 + 100 pA 0.003 + 5 pA
2 µA ±2.10000 µA 10 pA 1 MΩ 0.04 + 300 pA 0.002 + 20 pA
20 µA ±21.0000 µA 100 pA 100 kΩ 0.03 + 3 nA 0.002 + 200 pA
200 µA ±210.000 µA 1 nA 10 kΩ 0.03 + 30 nA 0.002 + 2 nA
2 mA ±2.10000 mA 10 nA 1 kΩ 0.03 + 300 nA 0.002 + 20 nA
20 mA ±21.0000 mA 100 nA 100 Ω 0.03 + 3 µA 0.002 + 200 nA
200 mA ±210.000 mA 1 µA 10 Ω 0.03 + 30 µA 0.002 + 2 µA
600 mA ±630.00 mA 10 µA 1 Ω 0.05 + 300 µA 0.003 + 10 µA

Note: If the integration time is less than 1 PLC, an additional value must be added. See manual for details.

AQ23811A Source Measure Unit Specs | Yokogawa Test&Measurement

Source and Measurement Functions

Accommodate different function combinations for each channel in each slot:

  • Voltage or Current
  • Generation or Measurement
  • Generation and Measurement

Source and Measurement Functions | AQ23811A Source Measure Unit | Yokogawa Test&Measurement

Source and Measurement Timing

Generate and measure starting from a trigger input such as an internal timer or external input signal. Generation begins after source delay time has elapsed, and measurement is performed with a set integration time when the measure delay time has elapsed. This allows measurements to be taken while avoiding the unstable timing immediately after an output change.

Source and Measurement Timing | AQ23811A Source Measure Unit | Yokogawa Test&Measurement

Sweep

SMU output waveforms are available in DC and pulse, with continuous output, linear sweep, log sweep, and program sweep.

Sweep | AQ23811A Source Measure Unit | Yokogawa Test&Measurement

Specifications

AQ23811A Source Measure Unit (±6 V / ±600 mA)

Items Specifications
Number of channels (Slot widths)2 channels (1 slot)
FunctionVoltage, Current
Output waveformDC, pulse (pulse width: 50 µs to 1 second)
Sweep modeLinear, Logarithmic, Program (up to 100001 steps)
Voltage sense2-wire, 4-wire
DC Voltage SourceRange: ±6.0000 V; resolution: 100 µV; maximum load current: ±600 mA / ±200 mA*1
DC Current SourceRange: ±200.000 nA to ±600.00 mA; minimum resolution: 1 pA; maximum load voltage: ±6 V / ±2 V*2
Output Noise (Typical)20 mVp-p (10 Hz to 20 MHz, 6 V voltage-source range, output open)
DC Voltage MeasurementRange: ±6.3000 V; resolution: 100 µV; accuracy: ±0.02% + 500 µV*3
DC Current MeasurementRange: ±210.000 nA to ±630.00 mA; minimum resolution: 1 pA; accuracy: 0.03% + 30 nA (200 µA range)*3
Response time (Typical) Voltage source 10 µs (6 V range, current limiter ±600 mA, output open)
Current source 15 µs (600 mA range, voltage limiter ±6 V, output short-circuited)
Calibration cycle1 year
Dimensions (excluding protrusions)106.5 (H) × 31 (W) × 321.5 (D) mm
Weight800 g
Note:
*1: Sink maximum load currents exceeding ±2 V are allowed up to ±200 mA.
*2: The sink maximum load voltage in the 600 mA range is allowed up to ±2 V.
*3: If the integration time is less than 1 PLC, an additional value must be added. Please refer to the manual for details.
Note: For details, please refer to another catalog “AQ2300 Series Source Measure Unit”.

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