Measurement of I/O Characteristics of Semiconductor Devices
The GS820 is used to apply voltage Vi to the gate input of a logic IC from channel 1 and measure gate output voltage Vo on channel 2. The source and measure channels allow the I/O characteristics of the gate to be measured.
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GS820 Source Measure Unit
- 2-Channel
- ±50 V / ±1.2 A or ±18V / ± 3.2 A
- Resolution: 1 µV / 1 pA
- Sweep: Linear, Log, Custom
- Output: DC, Pulse (50 µs to 3600 s)
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