AQ23811A Source Measure Unit (±6 V / ±600 mA)
The AQ23811A Source Measure Unit is ideal for testing semiconductor devices with low-to-medium currents and can be expanded up to 18 channels with a 9-slot frame.
- Source & Measure: ±6 V / ±600 mA
- Sink & Measure: ±6 V / ±200 mA
±2 V / ±600 mA - 2 channels (1 slot width)
- DC, Pulse (50 µs to 1 s)
- External trigger I/O
- Linear sweep, log sweep, program sweep
*The instruction manual is included in the AQ23011A,AQ23012A Frame instruction manual.
The AQ2300 Series SMU can be used for the evaluation and inspection of optical semiconductor components such as LD, PD, LED and modulator, and semiconductor components such as transistors and FET.
Static Testing of Laser Diode Module
Generate different voltages or currents from several channels and use the sweep synchronization function to measure the I/V or I/L characteristics of the LD.
Features
- Synchronization of LD current sweep with PD current measurement and optical power measurement
- Microcurrent measurement with a minimum resolution of 1 pA (200 nA range)
- Measurement data format in CSV or binary format
- Digital I/O interface supports SMU operation start and end response communication
Filter Characteristic Tests of WDM Photodiode Modules
Generate different voltages or currents from several wavelength division multiplexing (WDM) channels and use the sweep synchronization function to measure filter characteristics of each individual channel.
Features
- Synchronization of wavelength sweep and amplifier IC current measurement
- Microcurrent measurement with a minimum resolution of 1 pA (200 nA range)
- Measurement data format in CSV or binary format
Covers Applications from R&D to Production
Frame and SMU Features
The frames are available in 3-slot or 9-slot types and can be flexibly adapted to small and medium-sized measurement systems.
- Expandable up to 18 channels with 2-channel SMU
- Digital I/O interface can be selected
- 3-trigger synchronization systems
- Simultaneous measurement of voltage and current possible
- Simplified response adjustment
- High-speed data transfer
- Measurement data storage up to 100 k points per channel
- Channel-to-channel and module-to-module isolation
- Hot swappable modules
Digital I/O (Factory Option)
Receives the start-of-operation signal from external equipment and sends the end-of-operation signal to external equipment.
Digital I/O Interface Port Configurations
Save polling operations to monitor the timing of voltage or current generation start and end.
Various Trigger Synchronization Functions
The AQ2300 series SMU have trigger ports not only on the frame side, but also on each channel of the SMU. In addition, in-frame synchronization functionality is also provided, allowing flexible selection of the connection method.
Synchronize Frame with External Equipment
Synchronize Channel with External Equipment
Synchronize SMU Channels
More Optimized Response Adjustments
The AQ2300 SMU can be adjusted to reduce rising edge overshoot and ripple. These can be made easily by entering the R, L, and C values for the load.
High-Quality Pulse Generation and Measurement
The AQ2300 Series SMU can generate high-quality pulse signals with the response adjustment function and digital feedback technology.
- Minimum Pulse Width: 50 μs
- Minimum Cycle: 100 μs
Faster Data Transmission Speeds
Reduce the time between measurements for significantly improved operational efficiency.
Fewer Measurement Segments
Store measurement data up to 100 k points per channel to reduce the number of measurement segments or files.
Specifications
Note: If the integration time is less than 1 PLC, an additional value must be added. See manual for details.
Source and Measurement Functions
Accommodate different function combinations for each channel in each slot:
- Voltage or Current
- Generation or Measurement
- Generation and Measurement
Source and Measurement Timing
Generate and measure starting from a trigger input such as an internal timer or external input signal. Generation begins after source delay time has elapsed, and measurement is performed with a set integration time when the measure delay time has elapsed. This allows measurements to be taken while avoiding the unstable timing immediately after an output change.
Sweep
SMU output waveforms are available in DC and pulse, with continuous output, linear sweep, log sweep, and program sweep.
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