The AQ23811A Source Measure Unit is ideal for testing semiconductor devices with low-to-medium currents and can be expanded up to 18 channels with a 9-slot frame.
The AQ2300 Series SMU can be used for the evaluation and inspection of optical semiconductor components such as LD, PD, LED and modulator, and semiconductor components such as transistors and FET.
Static Testing of Laser Diode Module
Generate different voltages or currents from several channels and use the sweep synchronization function to measure the I/V or I/L characteristics of the LD.
Features
Generate different voltages or currents from several wavelength division multiplexing (WDM) channels and use the sweep synchronization function to measure filter characteristics of each individual channel.
Features
The frames are available in 3-slot or 9-slot types and can be flexibly adapted to small and medium-sized measurement systems.
Receives the start-of-operation signal from external equipment and sends the end-of-operation signal to external equipment.
Save polling operations to monitor the timing of voltage or current generation start and end.
The AQ2300 series SMU have trigger ports not only on the frame side, but also on each channel of the SMU. In addition, in-frame synchronization functionality is also provided, allowing flexible selection of the connection method.
Synchronize Frame with External Equipment
Synchronize Channel with External Equipment
Synchronize SMU Channels
The AQ2300 SMU can be adjusted to reduce rising edge overshoot and ripple. These can be made easily by entering the R, L, and C values for the load.
The AQ2300 Series SMU can generate high-quality pulse signals with the response adjustment function and digital feedback technology.
Reduce the time between measurements for significantly improved operational efficiency.
Store measurement data up to 100 k points per channel to reduce the number of measurement segments or files.
Note: If the integration time is less than 1 PLC, an additional value must be added. See manual for details.
Accommodate different function combinations for each channel in each slot:
Generate and measure starting from a trigger input such as an internal timer or external input signal. Generation begins after source delay time has elapsed, and measurement is performed with a set integration time when the measure delay time has elapsed. This allows measurements to be taken while avoiding the unstable timing immediately after an output change.
SMU output waveforms are available in DC and pulse, with continuous output, linear sweep, log sweep, and program sweep.