The High-resolution reflectometer accurately detects the quantity and location of reflections within optical connectors and modules. It reveals microcracks that standard loss measurements might miss, helping to avoid unpredictable and potentially detrimental failures.
Accurately detects the quantity and location of reflections within connectors and modules and reveals microcracks that standard loss measurements can miss.
- Measurement distance: 100 mm (approx. 4 inches)
- Spatial resolution: 40 μm
- Spurious noise: −100 dB avoids false (ghost) effects
- Simultaneous measurement of multiple reflection and insertion loss
Accurately detects the quantity and location of reflections within connectors, modules and SiP devices and reveals microcracks that standard loss measurements can miss.
- Measurement distance: 1000 mm (approx. 40 inches)
- Spatial resolution: 40 μm
- Spurious noise: −100 dB avoids false (ghost) effects
- Simultaneous measurement of multiple reflection and insertion loss
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