AQ6377E Five Micron 1900 - 5500 nm
The AQ6377E is an optical spectrum analyzer, offering extended wavelength coverage into the MWIR region from 1900 - 5500 nm.
In addition to the same excellent optical performance as the AQ6377, the AQ6377E has several improvements.
Key Features
- Wavelength range: 1900 to 5500 nm
- 5 wavelength resolution settings: 0.2 to 5 nm
Enables the user to choose the best value according to the device/system under test. - Wide measurement dynamic rang: 73 dB
Suitable to measure high power as well as low power sources used in different fields of application. Sensitivity: HIGH1-3 are only high dynamic mode. - Wavelength accuracy: ±0.5 nm
Easily maintained due to the built-in Calibration Function and wavelength reference source. - Close-in dynamic range: 50 dB
Measurement example of 3.39 μm HeNe Laser
- Horizontal scale also in Wave Number (cm−1)
In addition to the commonly-used scales in wavelength (nm) and frequency (THz).
Measurement example of 4.3 μm DFB-ICL
Equipped with a high-performance chopper
It is equipped with a high-performance chopper that operates automatically according to the setting sensitivity. This reduces the influence of infrared radiation within the measuring instrument and minimizes the impact of background noise during mid-infrared spectrum measurements.
Advanced pulsed light measurement mode
This mode enables measurement of pulsed light with various pulse widths and repetition rates.
Advanced pulsed light measurement mode
(AQ6377E, Pulsed light repetition rate: 1 kHz)
Purge Feature
Due to the high resolution and sensitivity of the AQ6377E, it can actually detect the presence of water molecules in the air. The water vapor is detected in the upper Near-IR wavelength region and could overlap with or mask the spectral characteristics of the actual device under test in that particular region.
By continuously supplying a pure purge gas such as nitrogen to the monochromator through the ports on the back panel, the AQ6377E can reduce the influence of water vapor absorptions and provide more reliable and accurate measurements than ever before.
Effect of gas purging (AQ6377E, Purging time: About 10 min.)
Built-in Cut Filter for High Order Diffracted Light
Due to the diffractive technology used, the monochromator in some circumstances could generate high order diffracted light, which appears at wavelengths equal to the integral multiple of input wavelengths.
By cutting incoming light below 1500 nm with the built-in filter, the AQ6377E drastically reduces the influence of high order diffracted light on the measurement. Thus, the measured data are always reliable and replicate the real signal under test.
Free-Space Optical Input
The AQ6377E uses a free-space optical input structure (i.e. no fiber is mounted inside the instrument), most effective for guaranteeing high coupling efficiency, measurement repeatability, and no maintenance.
This smart solution is:
- WORRY-FREE: no internal fiber can be scratched or get dirty by inaccurate coupling of fibers
- MAINTENANCE-FREE: no internal fiber has to be cleaned
- VERSATILE: the instrument accepts both /PC and /APC connectors
- DUAL PURPOSE: the instrument accepts both Single-Mode and Multi-Mode fibers without being affected by the high insertion loss from MM-SM fibers matching
DUT-oriented test apps simplify the test process
The appplication mode (APP) transforms an OSA into a versatile machine dedicated to a device under test (DUT). APP mode provides a DUT-specific user interface that navigates the user from configuration settings to test result output without worrying with other OSA settings. The AQ6377E comes pre-installed with several standard applications including DFB-LD testing, FP-LD testing and SC light source testing. Additional optional applications are available for download from the Yokogawa Test&Measurement website.
APP menu window
SC light source test application
Data Analysis Functions
Multiple data analysis functions are available that cover many popular applications:
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Seven Individual Traces
Users can directly select the trace using a mouse via simultaneous multi-trace display and employ Max/Min hold and calculation (subtraction) between traces
Smoothing
Reduces the noise on the measured spectrum.
Built-In Cut Filter
The built-in cut filter addresses instances when the monochromator generates high order diffracted light that appears at wavelengths equal to the integral multiple of input wavelengths.
Built-In Calibration Source
Ambient temperature change, vibrations, and shock can have an impact on an OSA's measurement accuracy. To ensure consistently precise measurements, the AQ6377E OSA is equipped with a built-in calibration source. The calibration process is fully automatic and takes only two minutes to complete and includes optical alignment, which automatically aligns the optical path in the monochromator to assure level accuracy, and wavelength calibration, which automatically calibrates the OSA with the reference source to ensure wavelength accuracy.
Advanced Marker
Adds markers to obtain power spectral density and integrated power of a designated spectrum for easier acquisition of a signal's OSNR value, modulated or not, directly from its spectrum.
Built-In Macro Programming
Create automated test systems to perform automatic measurements and control external equipment through a remote interface. GP-IB, and Ethernet ports are available for remotel control via PC and to transfer standard SCPI-compatible or proprietary AQ6317-compatible commands. LabVIEW® drivers are also available.
To accurately measure pulsed light using an optical spectrum analyzer (OSA), it is necessary to understand the characteristics of the OSA and select the appropriate measurement method and settings.
Laval University is a research institution world renowned for optics and photonics technology research and training, and are the founders of The Center for Optics, Photonics, and Lasers (COPL).
The university's researchers needed a faster and more efficient and practical solution to measure the spectral performance of lasers and optics beyond traditional telecom wavelengths. To achieve this, they contacted Yokogawa Test&Measurement and collaborated to develop a breakthrough grating-based optical spectrum analyzer that could cover MWIR wavelengths up to 5.5 um. Click to learn how productivity in the research lab dramatically increased for precise characterization of laser sources, and active/passive optical components in the fields of communications, medical diagnosis, advanced optical sensing, and environmental and atmospheric sensing.
Brochures
Product Overviews
Webinars
- Fiber identification and recommendations for routine care
- Measurement techniques for different optical measurement devices
- Example wavelength-specific applications for visible light to over 3000 nm such as telecommunications, biomedical, and atmospheric gas sensing
- Important considerations for selecting an optical spectrum analyzer
- The what, why, and how of available options like optical spectrum analyzers, optical wavelength meters, optical power meters, variable attenuators, fixed and tunable laser sources, and more
- How to improve the quality and value of results for both active and passive optical devices
- Ways to streamline productivity and reduce costs while also achieving higher data transmission rates, longer-distance transmissions, immunity to EMI, lower signal loss, lower latency, enhanced security, and improved energy efficiency
- Trends driven by applications such as AI, quantum, and inter-satellite laser communications (i.e., space lasers!)
Mastering the fundamentals of optical wavelength measurements and having a solid understanding of measurement principles for optical sources and devices is key to measuring with confidence. This webinar provides a thorough review of these foundational elements and concepts as well as:
There are countless technologies available for optical communications devices and systems validation. With so many specifics to take into consideration, it's not always easy for an engineer to determine the best networking and fiber optic measurement solution to address their measurement needs.
Key discussions in this on-demand webinar include: