OSA: Measurement of Temporal Change of Optical Power
Applicable model*: AQ6380/AQ6370 series/AQ6360
Yokogawa's optical spectrum analyzer is equipped with a "0 nm sweep function" that repeatedly measures the optical power of a specific wavelength and displays the change over time. It is also effective for aligning the optical axis, such as coupling an optical fiber to the light source.
0 nm Sweep function
When the wavelength span setting of the optical spectrum analyzer is set to 0 nm, the spectroscopic element (diffraction grating) is fixed at the center wavelength position. If you perform measurement (sweep) in this state, the change over time in the optical power at the center wavelength can be observed. The horizontal axis of the screen is changed to time. (Usually, wavelength) Before executing the 0 nm sweep, set the center wavelength to the measuring wavelength and the wavelength resolution to the maximum resolution (2 nm). This is to avoid missing the optical power due to changes in wavelength over time. Since the measurement (sweep) time can be set arbitrarily in [0nm SWEEP TIME]**, slow power changes can be displayed on one screen.
|
0nm sweep setting [CENTER] Set to a measuring wavelength [SPAN] 0nm Horizontal axis is set to time [RES] 2nm Set to the wide resolution not to miss the signal due to the wavelength drift [SENS] Set to a suitable sensitivity according to the optical power Normal = fast / for high power [0nm SWEEP TIME] Set the sweep time for the full span of screen as appropriate. |
* All versions unless otherwise specified.
** The sweep time depends on the measurement sensitivity (SENS) setting.
Therefore, it may take longer than the time set in [0nm SWEEP TIME].
Waveguide alignment and optical axis adjustment in spatial light experiments
Related Industries
Related Products & Solutions
AQ6361 Telecom Production 1200 - 1700 nm
- 0.03 nm resolution
- ±20 pm accuracy
- 65 dB close-in dynamic range
- -80 dBm level sensitivity
- Highest sweep speed
AQ6370E Telecom 600 - 1700 nm
- 0.02 nm resolution
- ±8 pm accuracy
- 78 dB close-in dynamic range
- -90 dBm level sensitivity
- Single-mode and multi-mode
AQ6373E Visible Wavelength 350 - 1200 nm
- 0.02 nm resolution
- ±50 pm accuracy
- 60 dB close-in dynamic range
- -80 dBm level sensitivity
- Single-mode and multi-mode
- Industrial & biomedical laser testing
AQ6374E Wide Wavelength Range 350 - 1750 nm
- 0.05 nm resolution
- ±50 pm accuracy
- 60 dB close-in dynamic range
- -80 dBm level sensitivity
- Single-mode and multi-mode
- Visible to communications wavelengths
AQ6375E Long Wavelength 1000 - 2500 nm
- 0.05 nm resolution
- ±50 pm accuracy
- 55 dB close-in dynamic range
- 90 dB measurement dynamic range
- -70 dBm level sensitivity
- Single-mode and multi-mode
- Advanced pulsed light measurement (APLM) mode
AQ6376E Three Micron 1500 - 3400 nm
- 0.1 nm resolution
- ±0.5 nm accuracy
- 55 dB close-in dynamic range
- 78 dB measurement dynamic range
- -65 dBm level sensitivity
- Single-mode and multi-mode
- Advanced pulsed light measurement (APLM) mode
AQ6377E Five Micron 1900 - 5500 nm
- 0.1 nm resolution
- ±0.5 nm accuracy
- 50 dB close-in dynamic range
- 73 dB measurement dynamic range
- -60 dBm level sensitivity
- Single-mode and multi-mode
- Advanced pulsed light measurement (APLM) mode
AQ6380 Highest Performance 1200 - 1650 nm and 900 - 1650 nm
- 0.005 nm (5 pm / 0.624 GHz) resolution
- ±5 pm accuracy
- 67 dB dynamic range
- -85 dBm level sensitivity
- O, C, and L-bands
Optical Spectrum Analyzers
- High-resolution measurement of optical power vs wavelength
- Ideal for R&D, manufacturing, and laser characterization
Optical Test Equipment
Advanced optical testing tools engineered to validate components and systems powering today’s high-speed fiber networks and emerging photonics technologies.