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OSA: Measurement of Temporal Change of Optical Power

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Applicable model*: AQ6380/AQ6370 series/AQ6360

Yokogawa's optical spectrum analyzer is equipped with a "0 nm sweep function" that repeatedly measures the optical power of a specific wavelength and displays the change over time. It is also effective for aligning the optical axis, such as coupling an optical fiber to the light source.

0 nm Sweep function

When the wavelength span setting of the optical spectrum analyzer is set to 0 nm, the spectroscopic element (diffraction grating) is fixed at the center wavelength position. If you perform measurement (sweep) in this state, the change over time in the optical power at the center wavelength can be observed. The horizontal axis of the screen is changed to time. (Usually, wavelength) Before executing the 0 nm sweep, set the center wavelength to the measuring wavelength and the wavelength resolution to the maximum resolution (2 nm). This is to avoid missing the optical power due to changes in wavelength over time. Since the measurement (sweep) time can be set arbitrarily in [0nm SWEEP TIME]**, slow power changes can be displayed on one screen.

 

0nm sweep setting

[CENTER]

Set to a measuring wavelength

[SPAN] 0nm

Horizontal axis is set to time

[RES] 2nm

Set to the wide resolution not to miss the signal due to the wavelength drift

[SENS]

Set to a suitable sensitivity according to the optical power Normal = fast / for high power
High *   =
slow / for low power

[0nm SWEEP TIME]

Set the sweep time for the full span of screen as appropriate.

0nm sweep setting

* All versions unless otherwise specified.

** The sweep time depends on the measurement sensitivity (SENS) setting.
    Therefore, it may take longer than the time set in [0nm SWEEP TIME].

 

Waveguide alignment and optical axis adjustment in spatial light experiments

Waveguide alignment and optical axis adjustment in spatial light experiments

相关行业

相关产品和解决方案

AQ6370E Telecom 600 - 1700 nm

  • 0.02 nm resolution
  • ±8 pm accuracy
  • 78 dB close-in dynamic range
  • -90 dBm level sensitivity
  • Single-mode and multi-mode
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AQ6375E 长波长光谱分析仪 1200~2400nm和 1000~ 2500 nm

  • 0.05 nm 分辨率
  • ±50 pm 精度
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  • -70 dBm 功率灵敏度
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AQ6376E 3µm光谱分析仪 1500 - 3400 nm

  • 0.1 nm 分辨率
  • ±0.5 nm 精度
  • 55 dB 动态范围
  • -65 dBm 功率灵敏度
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AQ6377E Five Micron 1900 - 5500 nm

  • 0.1 nm resolution
  • ±0.5 nm accuracy
  • 50 dB close-in dynamic range
  • 73 dB measurement dynamic range
  • -60 dBm level sensitivity
  • singlemode and multi-mode
  • MWIR wavelengths
  • Advanced pulsed light measurement (APLM) mode

光测量仪器

YOKOGAWA提供的解决方案可测量传统和前沿的光器件和系统,服务于日益增长的大容量光纤线路以及最新元器件技术。

光谱分析仪

YOKOGAWA的光谱分析仪质量高、技术先进,具备一流的可靠性和灵活性。这些产品的设计满足了研发、检测和生产对性能的要求。

光谱分析仪 AQ6380 1200 - 1650 nm

无与伦比的光学性能

更清晰、更深入、更精确

  • 高波长分辨率: 5pm
  • 高波长精度: ±5pm
  • 动态范围: 65dB
  • 高杂散光抑制比: 80dB

光通信产业专用高速光谱分析仪 AQ6361 1200-1700 nm

  • 0.03 nm 波长分辨率
  • ±20 pm 波长精度
  • 55 dB 动态范围
  • -80 dBm 功率灵敏度
  • 减少生产测试时间

可见光波长光谱分析仪 AQ6373E 350 - 1200 nm

  • 0.02 nm 分辨率
  • ±50 pm 精度
  • 60 dB 动态范围
  • -80 dBm 功率灵敏度
  • 单模和多模
  • 工业和生物医学激光测试

宽范围波长光谱分析仪 AQ6374E 350 - 1750 nm

  • 0.05 nm 分辨率
  • ±50 pm 精度
  • 60 dB 动态范围
  • -80 dBm 功率灵敏度
  • 单模和多模
  • 从可见光到通信波长

Precision Making

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