A probe is a device that takes and relays measurements.
Special AC-Input Clamp-on Probes for Large-current Hot Line Measurement
90020B -50 to 600°C (rounded end)
90021B -50 to 600°C (rounded end)
90022B -50 to 600°C (rounded end)
90023B -50 to 500°C (needle)
90024B -50 to 500°C (needle)
90029B -40 to 260°C (Bead TC)
90030B -20 to 250°C (Surface straight)
90031B -20 to 250°C (Surface angled)
90032B -20 to 500°C (Surface straight)
90033B -20 to 500°C (Surface angled)
90050B -50 to 600 ° C (For liquids)
90051B -50 to 600 ° C (For liquids)
90055B -20 to 250 ° C (For surfaces)
90056B -20 to 500 ° C (For surfaces)
To best utilize SiC devices for improved energy efficiency in equipment, it is important to optimize the internal device peripheral circuits in the inverter according to the device characteristics.
In research published by Yale University's Journal of Industrial Ecology (now owned and managed by the International Society of Industrial Ecology), researchers from the University of Nottingham and Dartmouth University use a Yokogawa Test&Measurement CW240 Clamp-On Power Analyzer to measure the real power consumption of the investigated printing systems.