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PSD Switching Measurement with High Definition Oscilloscope

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PSD*Switching Measurement with High Definition Oscilloscope

* Power Semiconductor Device

Issue:

The switching loss ("Power" in the example) is calculated by multiplying the output voltage(VDS) and current(Id) in the switching period (turn ON/turn OFF). The ON voltage is only a few volts for an output voltage of several hundred volts, but with a typical 8-bit oscilloscope, this is only 1 to 2 bits of AD resolution, and highly accurate measurements are not possible.

Solution:

The DLM5000HD with 12-bit ADC has 16 times the resolution of conventional 8-bit oscilloscopes, making it ideal for such wide dynamic range measurements. In addition, next-generation devices such as SiC/GaN have a high-speed rising switching voltage, which causes high-voltage ringing, and suppressing it is an important point in designing inverters.  High Definition Oscilloscope is also effective for such ringing/noise observations.

Example: SiC MOSFET double pulse test waveform

Example: SiC MOSFET double pulse test waveform

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The DLM5000HD High-Definition Oscilloscope from Yokogawa Test&Measurement is the new standard of high-definition oscilloscope.

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Precision Making

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