SPIE Photonics West 2026
Meet with the Precision Makers of Yokogawa Test&Measurement in Booth #1955 at the upcoming SPIE Photonics West 2026 conference, the world’s largest photonics technologies event covering cutting-edge research in biomedical optics, biophotonics, industrial lasers, optoelectronics, microfabrication, displays, quantum technologies, and more.
At this exhibition, Yokogawa will showcase:
- Optical Spectrum Analyzers
- AQ6373E - 350 to 1200 nm
- AQ6374E - 350 to 1750 nm
- AQ6375E - 1000 to 2500 nm
- AQ6376E - 1500 to 3400 nm
- AQ6377E - 1900 to 5500 nm
- AQ6380 - 1200 to 1650 nm
- AQ7420 High Resolution Reflectometer
These instruments support innovations through high speed, high-density production testing and validation. We look forward to seeing you there!
Not yet registered? Click here: SPIE Photonics West 2026
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AQ1210 Mid-Range OTDR
- 6 models in AQ1210 series
- Up to 42 dB dynamic range
- Wavelengths: 1310 / 1383 / 1490 / 1550 / 1625 / 1650 nm
AQ6360 Telecom Production 1200 - 1650 nm
- 0.1 nm resolution
- ±20 pm accuracy
- 55 dB dynamic range
- -80 dBm level sensitivity
- High sweep speed for manufacturing
AQ6370E Telecom 600 - 1700 nm
- 0.02 nm resolution
- ±8 pm accuracy
- 67 dB dynamic range
- -90 dBm level sensitivity
- Single-mode and multi-mode
AQ6373E Visible Wavelength 350 - 1200 nm
- 0.02 nm resolution
- ±50 pm accuracy
- 60 dB dynamic range
- -80 dBm level sensitivity
- Single-mode and multi-mode
- Industrial & biomedical laser testing
AQ6374E Wide Wavelength Range 350 - 1750 nm
- 0.05 nm resolution
- ±50 pm accuracy
- 60 dB dynamic range
- -80 dBm level sensitivity
- Single-mode and multi-mode
- Visible to communications wavelengths
AQ6375E Long Wavelength 1200 to 2400 nm and 1000 to 2500 nm
- 0.05 nm resolution
- ±50 pm accuracy
- 55 dB close-in dynamic range
- 90 dB measurement dynamic range
- -70 dBm level sensitivity
- Single-mode and multi-mode
- NIR and SWIR wavelengths
- Advanced pulsed light measurement (APLM) mode
AQ6376E Three Micron 1500 - 3400 nm
- 0.1 nm resolution
- ±0.5 nm accuracy
- 55 dB close-in dynamic range
- 78 dB measurement dynamic range
- -65 dBm level sensitivity
- Single-mode and multi-mode
- SWIR and MWIR wavelengths
- Advanced pulsed light measurement (APLM) mode
AQ6377 Five Micron 1900 - 5500 nm
- 0.1 nm resolution
- ±0.5 nm accuracy
- 50 dB dynamic range
- -60 dBm level sensitivity
- singlemode and multi-mode
- MWIR wavelengths
AQ6380 Highest Performance 1200 - 1650 nm and 900 - 1650 nm
- 0.005 nm (5 pm / 0.624 GHz) resolution
- ±5 pm accuracy
- 67 dB dynamic range
- -85 dBm level sensitivity
AQ7277B Remote OTDR
- Up to 50 dB dynamic range
- Wavelengths: 1550 / 1650 nm
- Live network or PON testing with built-in cut filter
AQ7280 Modular OTDR
- 13 module types
- Up to 50 dB dynamic range
- Wavelengths: 1310 / 1383 / 1490 / 1550 / 1625 / 1650 nm
AQ7420 (100 mm Model)
- Spatial resolution: 40 μm
- Spurious noise: −100 dB avoids false detections
- Simultaneous measurement of multiple reflection and insertion loss
High-Resolution Reflectometers
- Accurately detect microcracks within optical connectors
- Characterize reflections and gaps in silicon photonics devices
Optical Component Test System
- Modular platform for automated optical testing
- Attenuators, switches, power meters, light sources, and SMUs
Optical Spectrum Analyzers
- High-resolution measurement of optical power vs wavelength
- Ideal for R&D, manufacturing, and laser characterization
Optical Test Equipment
Advanced optical testing tools engineered to validate components and systems powering today’s high-speed fiber networks and emerging photonics technologies.
Optical Time Domain Reflectometers
- Instrument for optical fiber installation and maintenance
- Locate events or faults along a fiber
Optical Wavelength Meters
- High peak wavelength accuracy (±0.2 ppm)
- Wavelength & power of CW laser and DWDM systems
- FT interferometer-based design
Portable Ethernet Testers
- Portable & user friendly
- Improve work efficiency and quality
- Prevent operational errors
Portable Power Meters and Light Sources
- Portable, durable light source and optical power meter
- Test and verify insertion losses in optical fiber networks
Source Measure Units
A Source Measurement Unit (SMU) is a flexible test instrument which is capable of both sourcing and measuring voltage and/or current at the same time.