SPIE Photonics West 2025

• Up to 32 dB dynamic range
• Wavelengths: 1310 / 1550 nm

• 6 models in AQ1210 series
• Up to 42 dB dynamic range
• Wavelengths: 1310 / 1383 / 1490 / 1550 / 1625 / 1650 nm

This lineup includes 3-slot and 9-slot frames equipped with trigger synchronization and remote-control functions.

• AQ6360 optical analyzer
• Cost-effective optical spectrum analyzer
• Diffraction grating technology
• Ideal for optical device manufacturing

• 0.02 nm resolution
• ±8 pm accuracy
• 67 dB dynamic range
• -90 dBm level sensitivity
• singlemode and multi-mode

• 0.02 nm resolution
• ±50 pm accuracy
• 60 dB dynamic range
• -80 dBm level sensitivity
• singlemode and multi-mode
• industrial & biomedical laser testing

• 0.05 nm resolution
• ±50 pm accuracy
• 60 dB dynamic range
• -80 dBm level sensitivity
• singlemode and multi-mode
• visible to communications wavelengths

• 0.05 nm resolution
• ±50 pm accuracy
• 55 dB dynamic range
• -70 dBm level sensitivity
• singlemode and multi-mode
• NIR and SWIR wavelengths

• 0.1 nm resolution
• ±0.5 nm accuracy
• 55 dB dynamic range
• -65 dBm level sensitivity
• singlemode and multi-mode
• SWIR and MWIR wavelengths

• 0.1 nm resolution
• ±0.5 nm accuracy
• 50 dB dynamic range
• -60 dBm level sensitivity
• singlemode and multi-mode
• MWIR wavelengths

• 0.005 nm (5 pm / 0.624 GHz) resolution
• ±5 pm accuracy
• 67 dB dynamic range
• -85 dBm level sensitivity
• O, C, and L-bands

• OTDR for RFTS (Remote Fiber Test System)
• Live network or PON testing with built-in cut filter
• 2 models in AQ7277B Series
• Up to 50 dB dynamic range
• Wavelengths: 1550 / 1650 nm

• 13 module types
• Up to 50 dB dynamic range
• Wavelengths: 1310 / 1383 / 1490 / 1550 / 1625 / 1650 nm

Accurately detects the quantity and location of reflections within connectors and modules and reveals microcracks that standard loss measurements can miss.

• Measurement distance: 100 mm (approx. 4 inches)
• Spatial resolution: 40 μm
• Spurious noise: −100 dB avoids false (ghost) effects
• Simultaneous measurement of multiple reflection and insertion loss

The High-resolution reflectometer accurately detects the quantity and location of reflections within optical connectors and modules.
It reveals microcracks that standard loss measurements might miss, helping to avoid unpredictable and potentially detrimental failures.

A modular test platform with a wide selection of modules allows optimal configuration of test solutions for optical component and network systems manufacturing.

• Optical Spectrum Analyzer to measure and display power distribution of an optical source
• Optical analyzer trace displays power in vertical scale and wavelength in horizontal scale

• Yokogawa Test&Measurement optical test equipment solutions to measure optical components/systems
• Serves demand for high capacity fiber lines and new component technologies

• Precision instrument for optical fiber installation and maintenance
• Locate events or faults along a fiber

• Michelson interferometer-based optical wavelength meter
• High measurement performance 
• Meets measurement needs from optical wavelength measurement devices to optical transmission equipment

• Compact, lightweight portable ethernet testers
• Improve work efficiency and quality
• Easy to use ethernet analyzers 
• Prevent operational errors 

A compact portable light source and optical power meter are crucial tools to test and verify that insertion losses are within specifications in fiber links deployed by cable TV, enterprise, service provider, carrier, Ethernet and FTTH networks.

A Source Measurement Unit (SMU) is a flexible test instrument which is capable of both sourcing and measuring voltage and/or current at the same time.