Meet with the Precision Makers of Yokogawa Test&Measurement in Booth #2348 at the upcoming SPIE Photonics West 2025 conference, the world’s largest photonics technologies event covering cutting-edge research in biomedical optics, biophotonics, industrial lasers, optoelectronics, microfabrication, displays, quantum technologies, and more. Be sure to check out our optical measuring instrument lineup like our OSAs that cover 350nm to 5500nm (compatible with our trace stitching software) and our AQ2300 series test platform that supports innovations through high speed, high-density production testing and validation. We look forward to seeing you there!
Not yet registered? Click here: SPIE Photonics West 2025
Accurately detects the quantity and location of reflections within connectors and modules and reveals microcracks that standard loss measurements can miss.
A Source Measurement Unit (SMU) is a flexible test instrument which is capable of both sourcing and measuring voltage and/or current at the same time.