SPIE Photonics West 2025
Meet with the Precision Makers of Yokogawa Test&Measurement in Booth #2348 at the upcoming SPIE Photonics West 2025 conference, the world’s largest photonics technologies event covering cutting-edge research in biomedical optics, biophotonics, industrial lasers, optoelectronics, microfabrication, displays, quantum technologies, and more. Be sure to check out our optical measuring instrument lineup like our OSAs that cover 350nm to 5500nm (compatible with our trace stitching software) and our AQ2300 series test platform that supports innovations through high speed, high-density production testing and validation. We look forward to seeing you there!
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Related Products & Solutions
AQ1210 Mid-Range OTDR
- 6 models in AQ1210 series
- Up to 42 dB dynamic range
- Wavelengths: 1310 / 1383 / 1490 / 1550 / 1625 / 1650 nm
AQ6360 Telecom Production 1200 - 1650 nm
- 0.1 nm resolution
- ±20 pm accuracy
- 55 dB dynamic range
- -80 dBm level sensitivity
- High sweep speed for manufacturing
AQ6370E Telecom 600 - 1700 nm
- 0.02 nm resolution
- ±8 pm accuracy
- 78 dB close-in dynamic range
- -90 dBm level sensitivity
- Single-mode and multi-mode
AQ6373E Visible Wavelength 350 - 1200 nm
- 0.02 nm resolution
- ±50 pm accuracy
- 60 dB close-in dynamic range
- -80 dBm level sensitivity
- Single-mode and multi-mode
- Industrial & biomedical laser testing
AQ6374E Wide Wavelength Range 350 - 1750 nm
- 0.05 nm resolution
- ±50 pm accuracy
- 60 dB close-in dynamic range
- -80 dBm level sensitivity
- Single-mode and multi-mode
- Visible to communications wavelengths
AQ6375E Long Wavelength 1000 - 2500 nm
- 0.05 nm resolution
- ±50 pm accuracy
- 55 dB close-in dynamic range
- 90 dB measurement dynamic range
- -70 dBm level sensitivity
- Single-mode and multi-mode
- Advanced pulsed light measurement (APLM) mode
AQ6376E Three Micron 1500 - 3400 nm
- 0.1 nm resolution
- ±0.5 nm accuracy
- 55 dB close-in dynamic range
- 78 dB measurement dynamic range
- -65 dBm level sensitivity
- Single-mode and multi-mode
- Advanced pulsed light measurement (APLM) mode
AQ6377 Five Micron 1900 - 5500 nm
- 0.1 nm resolution
- ±0.5 nm accuracy
- 50 dB dynamic range
- -60 dBm level sensitivity
- singlemode and multi-mode
- MWIR wavelengths
AQ6380 Highest Performance 1200 - 1650 nm and 900 - 1650 nm
- 0.005 nm (5 pm / 0.624 GHz) resolution
- ±5 pm accuracy
- 67 dB dynamic range
- -85 dBm level sensitivity
- O, C, and L-bands
AQ7277B Remote OTDR
- Up to 50 dB dynamic range
- Wavelengths: 1550 / 1650 nm
- Live network or PON testing with built-in cut filter
AQ7280 Modular OTDR
- 7 module types
- Up to 50 dB dynamic range
- Wavelengths: 1310 / 1383 / 1490 / 1550 / 1625 / 1650 nm
AQ7420 (100 mm Model)
- Spatial resolution: 40 μm
- Spurious noise: −100 dB avoids false detections
- Simultaneous measurement of multiple reflection and insertion loss
High-Resolution Reflectometers
- Accurately detect microcracks within optical connectors
- Characterize reflections and gaps in silicon photonics devices
Optical Component Test System
- Modular platform for automated optical testing
- Attenuators, switches, power meters, light sources, and SMUs
Optical Spectrum Analyzers
- High-resolution measurement of optical power vs wavelength
- Ideal for R&D, manufacturing, and laser characterization
Optical Test Equipment
Market-leading optical test solutions with best-in-class OSAs to validate high-speed fiber networks and next-generation photonics systems.
Optical Time Domain Reflectometers
- Instrument for optical fiber installation and maintenance
- Locate events or faults along a fiber
Optical Wavelength Meters
- High peak wavelength accuracy (±0.2 ppm)
- Wavelength & power of CW laser and DWDM systems
- FT interferometer-based design
Portable Ethernet Testers
- Portable & user friendly
- Improve work efficiency and quality
- Prevent operational errors
Portable Power Meters and Light Sources
- Portable, durable light source and optical power meter
- Test and verify insertion losses in optical fiber networks
Source Measure Units
A Source Measurement Unit (SMU) is a flexible test instrument which is capable of both sourcing and measuring voltage and/or current at the same time.