Conference on Lasers and Electro-Optics (CLEO) 2026
Yokogawa Test&Measurement will be exhibiting at CLEO 2026 this May, showcasing our latest optical spectrum analyzer solutions—the AQ6373E and AQ6375E. Designed for high-precision optical characterization, these instruments deliver wide wavelength coverage, excellent sensitivity, and fast, accurate measurements for demanding photonics and optical communication applications. Visit our booth to see how Yokogawa’s trusted measurement technology supports cutting-edge research, development, and manufacturing in advanced optics.
Related Products & Solutions
AQ6373E Visible Wavelength 350 - 1200 nm
- 0.02 nm resolution
- ±50 pm accuracy
- 60 dB close-in dynamic range
- -80 dBm level sensitivity
- Single-mode and multi-mode
- Industrial & biomedical laser testing
AQ6375E Long Wavelength 1000 - 2500 nm
- 0.05 nm resolution
- ±50 pm accuracy
- 55 dB close-in dynamic range
- 90 dB measurement dynamic range
- -70 dBm level sensitivity
- Single-mode and multi-mode
- Advanced pulsed light measurement (APLM) mode
Optical Spectrum Analyzers
- High-resolution measurement of optical power vs wavelength
- Ideal for R&D, manufacturing, and laser characterization
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