PSD Switching Measurement with High Definition Oscilloscope
PSD*Switching Measurement with High Definition Oscilloscope
* Power Semiconductor Device
Issue:
The switching loss ("Power" in the example) is calculated by multiplying the output voltage(VDS) and current(Id) in the switching period (turn ON/turn OFF). The ON voltage is only a few volts for an output voltage of several hundred volts, but with a typical 8-bit oscilloscope, this is only 1 to 2 bits of AD resolution, and highly accurate measurements are not possible.
Solution:
The DLM5000HD with 12-bit ADC has 16 times the resolution of conventional 8-bit oscilloscopes, making it ideal for such wide dynamic range measurements. In addition, next-generation devices such as SiC/GaN have a high-speed rising switching voltage, which causes high-voltage ringing, and suppressing it is an important point in designing inverters. High Definition Oscilloscope is also effective for such ringing/noise observations.
Example: SiC MOSFET double pulse test waveform
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DLM3000HD Series High-Definition Oscilloscope
The DLM3000HD redefines high-definition in a compact design
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- Bandwidth: 350 or 500 MHz
- Sample Rate: up to 2.5 GS/s
- Vertical resolution: 12-bit
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- Measurement memory: up to 1 GigaPoints
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DLM5000HD Series High-Definition Oscilloscope
The DLM5000HD series sets a new standard for high-definition oscilloscopes.
- 4 or 8 analog channels
- 16-bit logic + optional additional 16-bit logic
- Bandwidth: 350 or 500 MHz
- Sample Rate: up to 2.5 GS/s
- Vertical resolution: 12 bit
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