2008 Events

April

UART, I2C/SPI/SM, CAN/LIN/Flexray: Tips & Tricks for Serial bus Protocol Analysis & Physical layer Troubleshooting using MSOs

Serial data buses have become increasingly common, core components of most electronic designs. As a design or test engineer, you presently need to use a protocol analyzer, logic analyzer, digital oscilloscope, or a combination of all three in order to debug serial bus signals. However, none of these instruments by themselves give you a complete picture of the physical and protocol layers—until now.

Event
Apr 17, 2008

July

UART, I2C/SPI/SM, CAN/LIN/Flexray: Tips & Tricks for Serial bus Protocol Analysis & Physical layer Troubleshooting using MSOs Webinar

Serial data buses have become increasingly common, core components of most electronic designs. As a design or test engineer, you presently need to use a protocol analyzer, logic analyzer, digital oscilloscope, or a combination of all three in order to debug serial bus signals. However, none of these instruments by themselves give you a complete picture of the physical and protocol layers—until now.

Event
Jul 24, 2008

August

Power Measurement & Harmonic Analysis: Applications using latest Digital Power Analyzers

Power Measurement & Harmonic Analysis Seminar is the second part from the Yokogawa T&M University series on precision AC power measurements.

Event
Aug 26, 2008

October

Introduction & Use of an Optical Spectrum Analyzer Webinar

Sign up now for our free training on the many uses of an Optical Spectrum Analyzers. This one hour presentation covers the basics of light, the design, measurement, and test applications of an OSA.

Event
Oct 14, 2008

November

When 8-bit Scopes Aren't Enough: High-Resolution Isolated, Mixed-Signal Instruments for Electro-Mechanical Measurements Webinar

We all know what a difference the right tool can make. While traditional 8-bit oscilloscopes are the right choice in many situations, they often are not the best choice when making mixed signal, power and/or electro-mechanical measurements.

Event
Nov 13, 2008

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