The TA720 Time Interval Analyzer has larger memory capacity and is faster than the highly regarded TA520 and TA320. It has a maximum sampling rate of 80 MS/s, and maximum memory capacity of 1024 k samples (in Time stamp mode). In addition, the TA720 has a variety of completely new functions, such as a dual measurement function, inter-symbol interference analysis function, and an optional Ethernet and PC card interface. This time interval analyzer is the ideal analysis tool for jitter analysis of high-speed optical disk signals and recording characteristic evaluations.
Highlights of this Time Interval Analyzer, include:
Continuous measurement at up to 80 MS/s
High-Speed Continuous Measurement at up to 80 MS/s
Continuous Measurement at up to 80 MS/s and Inter-Symbol Interference Analysis with Dual Measurement
The TA720 Time Interval Analyzer has larger memory capacity and is faster than the highly regarded TA520 and TA320. It has a maximum sampling rate of 80 MS/s, and maximum memory capacity of 1024 k samples (in Time stamp mode). In addition, the TA720 has a variety of completely new functions, such as a dual measurement function, inter-symbol interference analysis function, and an optional Ethernet and PC card interface. This time interval analyzer is the ideal analysis tool for jitter analysis of high-speed optical disk signals and recording characteristic evaluations.The TA720 contains multiple counter circuits with 25 ps resolution. When these circuits are switched at high speed, the TA720 is capable of time measurement at up to 80 MS/s (12.5 ns period; see below). For example, the TA720 can continuously measure 1-7 modulation signals without dropping data, if the minimum 2T pulse width is 12.5 ns or greater. (Note: This does not apply during dual measurement function) |
The dual measurement function can be used to simultaneously measure an optical disk's data-data jitter and data-clock jitter. In the past, it was necessary to do these measurements separately, so there was a need for steps such as synchronization using an index signal from a spindle motor as a measurement-start control signal. With the TA720, however, these two measurements can be done simultaneously, so data-data jitter and data-clock jitter from the same measurement area are obtained at the same time. | Example of simultaneous measurement of pulse width and data-clock jitter. |
This function extracts data corresponding to specified conditions, such as jitter for each space length immediately following a 3T mark, and jitter in each space length between one 3T mark and another. This data can be used to analyze the effects of the code on jitter. The inter-symbol interference analysis function is useful for evaluating recording strategies, such as recording power control and phase control, and recording waveforms. The distribution of the extracted data and related statistics can also be displayed and compared against all of the data at the same time. Code length settings that can be selected include arbitrary code length (nT), length shorter than a specified code length (NT>), and length longer than a specified code length (NT | Example of jitter measurement for each space length between 3T Marks |
Single | Combination | Between |
Extract data immediately before or immediately after a specified code length. | Specify consecutive code and extract data immediately preceding or following them. | Specify codes preceding and following the data to be extracted. |
Using the Dual Measurement Function and Inter-Symbol Interference Analysis Function in Combination
The inter-symbol interference analysis function can be used in combination with the dual measurement function (Pulse A & A-to-B time interval) to extract data-clock time difference data at each recording length (pulse width).
Examples of data-clock extraction in case of EFM+ dataData-Clock Data Immediately Following 3T | Data-Clock Data Immediately Following 4-14T | Data-Clock Data Excluding 3T Marks and Spaces |
The TA720 can simultaneously display histograms and statistics for both the positive and negative pulse widths. Numerical individual jitter values, distributions (difference between average value and ideal value for each pulse width), and the like can be checked while comparing the positive and negative histograms. In addition, it is possible to display bipolar histograms and statistics. |
This function allows you preset up to 14 windows for simultaneous analysis and display of histograms and statistics in those windows. During dual measurement function, data-data and data-clock histograms and statistics can be displayed at the same time. In cases where the CAV control is used and the data rate changes according to disk position, the auto-window function is useful for automatically adjusting the window setting. This function provides an Estimated T method, in which the clock period is estimated from the average data signal value; and a Measured T method, in which the clock period is measured from the CHB input signal. The clock period is measured to automatically adjust the window position. | Example of multi-window screen simultaneous display of data-data and data-clock histograms |
Histogram Display (Half Size) When the histogram is set to half size, the statistics display is enlarged. | List Display During the time stamp mode, the individual measurement values and the time elapsed from the start of measurement are displayed. The graph is displayed at the same time so detailed data can be checked while viewing the broader trend |
Statistics Display During bipolar pulse width measurement, statistics for both positive and negative pulse widths are displayed at the same time. | Time Variation Display (Dual Measurement Example Shown) This display can be used to display and analyze trends in measurement values over time. During dual measurement, it is possible to separately display data trends for two measurement functions. |
Symbol Search Function In time stamp mode or Inter-Symbol Interference analysis mode, as many as four consecutive symbols (recording length nT) can be specified to search for data matching the symbol conditions. | Jitter and Deviation Graph Display In this type of display, a histogram display is shown on top, and a jitter graph, deviation graph, or statistics list (selected by user) is displayed on the bottom. This type of display is useful for evaluating trends for each recording length nT on an optical disk. |
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Save Data and Screenshots to a Network Drive
You can save, delete, and copy waveform data and settings on storage media such as the internal floppy drive or a hard drive located on a networked PC or workstation. These operations work the same way as when you handle data on the PC card. In addition, screenshot data can also be saved. The TA720's FTP client function can be used to save, delete, and copy waveform data and settings on PCs and workstations running the FTP server function.
Access a Drive on the TA720 from a PC to Download Files from the Internal Floppy Drive or PC Card
You can download files from the TA720's internal floppy drive or PC card to a networked PC or workstation. The TA720's FTP server function can be used by PCs and workstations running the FTP client function.
A PC can be used to set measurement conditions on the TA720 and control when measurement starts and stops. | The TA720's Ethernet connector is a 10BASE-T connector. Connect it to your network through a hub or router as shown. |
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